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Hot carrier 현상에 의한 CMOS 차동 증폭기의 성능 저하
박현진,유종근,정운달,박종태 대한전자공학회 1997 電子工學會論文誌, D Vol.d34 No.7
The performance degradation of CMOS differential amplifiers due to hot carrier effect has been measured and analyzed. Two-state CMOS amplifiers whose input transistors are PMOSFETs were designed and fabriacted using the ISRC CMOS 1.5.mu.m process. It was observed after the amplifier was hot-carrier stressed that the small-signal voltage gain and the input offset voltage increased and the phase margin decreased. The performance variation results from the increase of the transconductances and gate capacitances of the PMOSFETs used as input transistors in the differential input stage and the output stage and also resulted from the decrease of their output conductances. After long-term stress, the amplifier became unstable. The reason might be that its phase margin was reduced due to hot carrier effect.
이용동,김형근,정운달,Lee, Yong-Dong,Kim, Hyoung-Geun,Jeong, Woon-Dal 한국음향학회 1996 韓國音響學會誌 Vol.15 No.6
본 논문에서는 한글의 형태소 분석에 기초한 청각장애자용 수화영상 변환시스템을 제안하였다. 제안된 시스템은 입력 문자열에 대해 형태소 분석에 의한 음운성분과 접속정보를 추출한 다음, 이에 대응한 수화영상을 구축된 수화영상 데이터베이스를 통하여 정확히 출력한다. 효과적인 수화영상변환을 위해 입력문자열에 대한 형태소 분석부와 수화패턴 참조를 위한 수화언어기술부로 이루어진 언어정보기술사전을 구성하였다. 수화패턴은 중복을 피하기 위해 기본수화, 복합수화 그리고 유사수화단어로 분류하여 작성하였으며, 실험을 통해 제안된 시스템의 유용성을 확인하였다. In this paper we have proposed the sign language transformation system for deaf based on a morpheme analysis. The proposed system extracts phoneme components and connection informations of the input character sequence by using a morpheme analysis. And then the sign image obtained by component analysis is correctly and automatically generated through the sign image database. For the effective sign language transformation, the language description dictionary which consists of a morpheme analysis part for analysis of input character sequence and sign language description part for reference of sign language pattern is costructed. To avoid the duplicating sign language pattern, the pattern is classified a basic, a compound and a similar sign word. The computer simulation shows the usefulness of the proposed system.
Hot-Carrier 현상에 의한 Folded-Cascode CMOS OP-Amp의 성능 저하
김현중,유종근,정운달,박종태 대한전자공학회 1997 電子工學會論文誌, D Vol.d34 No.12
This study presents the first experimental data for the impact of hot-carrier degradtion on the performance of CMOS folded-cascode op-amps. A folded-cascode op-amp which has an NMOS input pair has been designed and fabricated using a 0.8.mu.m single-poly, double-metal CMOS process. After high voltage stress, the degradtion of perfomrance parameters such as open-metal CMOS process. After high voltage stress, the degradation of performance parameters such as open-loop voltage gain, unity-gain frequency and phase margin has been analized and physically explaniend in terms of hot carrier degradation.