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Ag(001)에 성장된 NiO 극초박막의 화학 결함 연구
양설운,성시진,김재성,황한나,황찬국,장영준,박수현,민항기,Yang, Seol-Un,Seong, Shi-Jin,Kim, J.S.,Hwang, Han-Na,Hwang, C.C.,Chang, Young J.,Park, Soo-Hyon,Min, H.G. 한국진공학회 2007 Applied Science and Convergence Technology Vol.16 No.5
NiO 극초박막을 Ag(001) 단결정 위에 성장하는 과정에서 발생하는 화학 결함들을 X선 광전자 분광법을 이용하여 연구하였다. 특히 박막 두께, 산소 분압, 물 분압, 기판 온도 등을 잘 제어한 성장 환경에서 얻어진 O 1s, Ni 2p 스펙트라의 분석을 통하여 NiO 극초박막 성장 시 형성되는 화학 결함들의 정체를 일관성 있게 밝혀내었다. 이를 통하여 결함 밀도를 최소화 할 수 있는 최적의 성장 조건을 제안할 수 있게 되었다. We have researched the chemical defects of NiO ultrathin films grown on Ag(001) by x-ray photoelectron spectroscopy. In particular, O 1s and Ni 2p spectra were analyzed consistently with control film thickness, $O_2\;and\;H_2O$ partial pressure and substrate temperature. As a result, we could identify each chemical defect. In addition, we suggest the optimum growth condition to minimize the defect density.
Electronic Structure of Ultrathin NiO Films on Ag(001)
양설운,성시진,J.-S. Kim 한국물리학회 2010 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.57 No.5
The electronic sructure of ultrathin NiO films on Ag(001) is studied by photoelectron spectroscopy. NiO films interact with Ag substrate very weakly; The hybridization is limited to Ag 5s of the substrate and Ni 3d and O 2p states of the NiO layer neighboring the Ag substate. Such hybridization produces distinct interface oxide states around Fermi energy, and makes the interface NiO layer metallic, confirming the previous theoretical predictions.
Chemical Defects in Ultrathin NiO Films on Ag(001)
김재성,양설운 한국물리학회 2010 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.56 No.2
Ultrathin NiO films are grown on Ag(001) under well-defined conditions with careful control over both O2 and H2O partial pressures and substrate temperatures. Chemical defects in the NiO films are unambiguously identified and characterized by high resolution x-ray photoelectron spectroscopy of O 1s and Ni 2p states using synchrotron radiation. Based on correlations between growth conditions and the presence of defects, optimum growth conditions are suggested for the formation of NiO films on Ag(001) that are free from chemical defects.