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생물학적제제의 치메로살 함량 정량을 위한 가열기화 아말감 흡광도법의 확립 및 검증
김병철,김도근,홍성화,김연희,임종미,원윤정,김석환,홍지영,윤영민,김재옥,Kim, Byung-Chul,Kim, Do-Keun,Hong, Sung-Hwa,Kim, Yeon-Hee,Lim, Jong-Mi,Won, Yun-Jung,Kim, Seok-Hwan,Hong, Ji-Young,Yun, Young-Min,Kim, Jae-Ok 대한약학회 2011 약학회지 Vol.55 No.4
The test method for biologics of lot release system is based on 'Test procedure and specification for biological products,' generally, thimerosal content is measured by chemical analysis using O.D. In this study, the comparative analysis was carried out using the gold amalgamation method for thimerosal content was compared to the existing methods, which are described above. The gold amalgamation method, which uses atomic absorption spectrophotometry, was meets all the method validation acceptance criteria. It is considered to be proper as the assay and identification test for thimerosal. In this study, the comparative analysis was performed three times. As a result, gold amalgamation method is more convenient and easy to perform as this assay doesn't have pre-treatment procedure. Also this assay showed good precision and reproducibility compared to the conventional method. Therefore, it is appropriate to alternate the assay method of thimerosal from the conventional chemical analysis to gold amalgamation method to improve the credibility of lot release system and the quality control of biologics, by standardizing test method.
김병철,최성종,김휘택,류총일,정성원,은일수,구정모,김종균,Kim, Byung-Cheol,Choi, Sung-Jong,Kim, Hui-Taek,Yoo, Chong-Il,Jung, Sung-Won,Eun, Il-Soo,Ku, Jeong-Mo,Kim, Jong-Kyun 대한족부족관절학회 2005 대한족부족관절학회지 Vol.9 No.1
Purpose: To report our opinions of management about avascular necrosis following operative treatment of talar fracture and dislocation. Materials and Methods: We followed up 5 patients who were diagnosed as talar avascular necrosis after operation of talar fracture and dislocation. Clinical and radiological analysis were performed. The mean age of patients was 36 years. There were 4 males and 1 females. The average follow up was 51 months. Hawkins scoring system was used as clinical evaluation. Results: Regardless of radiological sclerotic finding, all patients showed satisfactory clinical result. Despite arthritic change in one patient, there were no further radiological and clinical deterioration to require salvage procedure. Conclusion: Most avascular necrosis after operative treatment of talar fracture and dislocation showed satisfactory result with conservative treatment. Thus, salvage operation such as talectomy or ankle fusion should be reserved in cases of intractable ankle pain and claudication.
장방형내 함수 다공성 물질의 동결거동에 관한 실험적 연구
김병철,김종일,김진흥,Kim, B.C.,Kim, J.I.,Kim, J.H. 대한설비공학회 1991 설비공학 논문집 Vol.3 No.5
Freezing of saturated porous media contained in a rectangular cavity has been studied experimentally. Water and different diameter glass beads consitituted the liquid and porous media. Solidification front shape, the effects of bead diameter and initial liquid temperature was investigated. When the hot wall temperature was below $4^{\circ}C$, the freezing rate was higher at the top than at the bottom due to the density inversion, but with increasing the hot wall temperature the freezing rate at the top was effected by the liquid temperature and was lower than at the bottom. With increasing the bead diameter, the difference of freezing rate between top and bottom was increased and depends on thermal conductivity. When the liquid temperature was low in the beginning, the freezing rate was high, but with increasing the time almost the same with those of high temperature liquid.
UV LED의 광효율 및 방열성능 향상을 위한 new packaging 특성 연구
김병철,박병선,김형진,김용갑,Kim, Byoung Chol,Park, Byeong Seon,Kim, Hyeong-Jin,Kim, Yong-Kab 한국스마트미디어학회 2022 스마트미디어저널 Vol.11 No.9
센서 및 분석 경화시장에서 폭넓게 사용되고 있는 기존의 UV 광원들이 점차 LED로 교체 적용되고 있다. 그러나 UV LED의 광 성능이 기존 램프에 비하여 여전히 낮고 광 효율성도 낮아 효능성 감소 및 수명 저하 문제가 존재한다. 현재 환경과 UV램프의 기술적인 문제로 인하여 점차 LED교체가 이루어지고 있는 시점에서 UV LED의 성능 향상이 매우 중요하다. 본 연구에서는 UV LED의 수명 증가 및 성능 향상을 위한 new package 설계 및 분석을 실행하였다. 광소자에서 발생하는 열을 직접 방출하기 쉽도록 방열특성이 우수한 packaging 설계가 매우 중요한데, 본 연구에서는 열적 안전성을 기반으로 안정성이 우수한 패키지 구성 및 UV LED용 new packaging을 설계 구현하였다. 이를 통하여 광 효율 및 방열성능 향상을 위한 새로운 UV LED용 new packaging을 구성하고 전기적 광학적 특성을 각각 분석하였다. 또한 UV LED package의 방열성능 향상을 위해 높은 반사율 특성을 가지는 알루미늄(Al)를 이용, 최적의 렌즈 포커싱를 적용함으로서 광출력 효율을 증가 시킬 수 있었다. 기존 은(Ag)대비 광효율 결과가 약 ~30%이상 개선되었으며, 새로 적용된 광소자 패키지에서 광출력 저하 특성이 약 10% 이상 향상됨을 확인 할 수 있었다.
김병철,Kim, Byung-Cheul 한국정보통신학회 2009 한국정보통신학회논문지 Vol.13 No.4
본 연구에서는 정보가전기기에서 과부하를 방지하고 이상신호를 검출하며 화재방지를 제어할 수 있는 원 칩(one chip) 시스템 IC를 개발하였다. 이를 위하여 화재에 직접적으로 영향을 미치는 아크(arc) 검출회로와 감전을 방지하기 위한 누전검출회로를 설계하였다. 시뮬레이션과 표준트랜지스터를 이용한 bread boarding 평가에 의해 블록별로 설계된 회로를 검증하였다. 평가결과로부터 34 V 2 Metal $1.5{\mu}m$바이폴라 트랜지스터 공정을 이용하여 시스템 IC를 제작하였다. 제작된 시스템 IC와 IC응용회로를 PCB보드에 실장하여 화재방지 시스템보드의 전기적 성능을 평가하였으며, 아크와 GF(ground fault) 신호에 잘 동작함을 확인하였다. In this study, we have developed one chip system IC for preventing the overload, detecting an abnormal conditions, and controlling the fire prevention in the intelligent home appliances. For the purpose, a circuit detectable an electric leak for preventing an electric shock, and a circuit detectable arc that has effect directly on the fire are designed. The circuits designed on every block are verified by comparing simulation with bread-boarding using a standard transistors. The system IC is fabricated by using 34 V 2 metal $1.5{\mu}m$ bipolar transistor process from evaluation results. The electrical performances of IC application circuits and the system IC equipped on PCB board are evaluated. It is confirmed that the system IC is well operated for arc and ground fault(GF) signal.
아크이미지, 아크전압과 유한요소해석을 통한 나선형 VI 전극 간의 비틀림 각도에 따른 아크거동분석
김병철,박홍태,손진우,임기조,Kim, Byoung-Chul,Park, Hong-Tae,Son, Jin-Woo,Lim, Kee-Joe 한국전기전자재료학회 2009 전기전자재료학회논문지 Vol.22 No.4
In this paper arc behavior in spiral type vacuum interrupter(VI) was analyzed by means of arc images, arc voltages and finite element method(FEM). As a result of experiment, the difference of arc voltage was observed under different twisting angles. It was found that the reason of the difference was the difference of arc resistance from simultaneous analysis of arc images and arc voltages. and the difference of arc resistance was explained by Lorentz force calculation with FEM. And the results of calculation were sufficient to explain the experimental results.
NAND 전하트랩 플래시메모리를 위한 p채널 SONOS 트랜지스터의 특성
김병철,김주연,Kim, Byung-Cheul,Kim, Joo-Yeon 한국전기전자재료학회 2009 전기전자재료학회논문지 Vol.22 No.1
In this study, p-channel silicon-oxide-nitride-oxide-silicon(SONOS) transistors are fabricated and characterized as an unit cell for NAND flash memory. The SONOS transistors are fabricated by $0.13{\mu}m$ low power standard logic process technology. The thicknesses of gate insulators are 2.0 nm for the tunnel oxide, 1.4 nm for the nitride layer, and 4.9 nm for the blocking oxide. The fabricated SONOS transistors show low programming voltage and fast erase speed. However, the retention and endurance of the devices show poor characteristics.
아크지속시간 측정을 통한 나선형 VI 전극의 전극배치에 따른 아크제어 성능비교
김병철,박홍태,오일성,임기조,Kim, byoung-Chul,Park, Hong-Tae,Oh, Ill-Sung,Lim, Kee-Joe 한국전기전자재료학회 2009 전기전자재료학회논문지 Vol.22 No.2
One of the purposes of arc control is to change its state to the diffuse state before current zero as soon as possible. This can provide optimal conditions for full extinction of arc by minimizing the quantity of residual plasma between contacts near current zero. TRV(transient recovery voltage) occurs at current zero at the same time with current interruption. If there is substantial residual plasma near current zero it can cause 'post arc current' by the interaction of its conductance with TRV. In this paper, arc control ability as a function of configuration of spiral type VI contacts was compared on the criteria of the time taken for arc to reach to the diffuse state.
김병철,김형우,서길수,Kim, Byung-Cheul,Kim, Hyoung-Woo,Seo, Kil-Soo 한국전기전자재료학회 2007 전기전자재료학회논문지 Vol.20 No.3
The accelerated aging test equipment which is possible to apply voltage and temperature at the same time, is fabricated to predict lifetime of high capacity thyristor in short time. The variations of the forward/reverse breakdown voltage and the leakage current are investigated as an aging diagnostic tool. Lifetimes of the devices which are predicted from the reverse breakdown voltage with an accelerated aging time, have shown 3-15 years.