http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
R . F . PACD에 의하여 증착된 TiN의 경도와 밀착력에 미치는 모재 경도의 영향
김성기,김문일 ( S . K . Kim,M . I . Kim ) 한국열처리공학회 1991 熱處理工學會誌 Vol.4 No.1
This study was to investigate the influence of the substrate hardness on the hardness and adhesion of TiN thin film deposited by R. F. PACVD. Although the substrate hardness changed, chemical composition, stoichiometry and structure of TiN thin film did not change. ISE index was 1.96-1.99 for the substrate and was 1.57-1.79 for TiN thin film. And ISE index of TiN thin film was inverse proportion to the substrate hardness. When the substrate hardness was low, TiN thin film had many cracks around the indentation. But as the substrate hardness increased, TiN thin film had a few cracks and the deformation was limited within indentation. In having measured the adhesion of TiN thin film by SAT, the critical load(Lc) generally increased as the substrate hardness decreased.