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$Cd_{1-x}Zn_{x}S$ 박막의 성장과 광전도 특성
이상열,홍광준,유상하,신용진,이관교,서상석,김혜숙,윤은희,김승욱,박향숙,신영진,정태수,신현길,김태성,문종대,이충일,전승룡,Lee, S.Y.,Hong, K.J.,You, S.H.,Shin, Y.J.,Lee, K.K.,Suh, S.S.,Kim, H.S.,Yun, E.H.,Kim, S.U.,Park, H.S.,Shin, Y.J.,Jeong, T.S.,Shin, 한국센서학회 1995 센서학회지 Vol.4 No.3
Chemical bath deposition(C.B.D.)방법으로 다결정 $Cd_{1-x}Zn_{x}S$ 박막을 스라이드 유리(coming-2948) 기판위에 성장시켜 열처리하고 X-선 회절무늬를 측정하여 결정구조를 밝혔다. $550^{\circ}C$로 $N_{2}$ 속에서 열처리한 시료의 X-선 회절무늬로부터 외삽법으로 구한 격자상수는 CdS인 경우 $a_{0}\;=\;4.1364{\AA}$, $c_{0}\;=\;6.7129{\AA}$였으며 ZnS인 경우는 $a_{0}\;=\;3.8062{\AA}$, $c_{0}\;=\;6.2681{\AA}$였다. Van der Pauw 방법으로 Hall 효과를 측정하여 운반자 농도와 이동도의 온도 의존성을 연구하였다. 광전도 셀의 특성으로 스펙트럼응답 감도, 최대허용소비전력 및 응답시간을 측정하였다. Polycrystalline $Cd_{1-x}Zn_{x}S$ thin film were grown on slide glass(corning-2948) substrate using a chemical bath deposition (C.B.D) method. They were annealed at various temperature and X -ray diffraction patterns were measured by X-ray diffractometor in order to study $Cd_{1-x}Zn_{x}S$ polycrystal structure using extrapolation method of X-ray diffraction patterns for the CdS, ZnS sample annealed in $N_{2}$ gas at $550^{\circ}C$. It was found hexagonal structure which had the lattice constant $a_{0}\;=\;4.1364{\AA}$, $c_{0}\;=\;6.7129{\AA}$ in CdS and $a_{0}\;=\;3.8062{\AA}$, $c_{0}\;=\;6.2681{\AA}$ in ZnS, respectively. Hall effect on these sample was measured by Van der Pauw method and then studied on carrier density and mobility depending on temperature. We measured also spectral response, sensitivity maximum allowable power dissipation and response time on these sample.
이상열,홍광준,유상하,신용진,이관교,서상석,김혜숙,윤은희,김승욱,박향숙,신영진,정태수,신현길,김택성,문종대,이충일,전승룡 ( S . Y . Lee,K . J . Hong,S . G . You,Y . j . Shin,K . K . See,S . S . Suh,H . S . Kim,E . H . Yun,S . U . Kim,H . S . Park,Y . 센서 한국센서학회 1995 센서학회지 Vol.4 No.3
Polycrystalline Cd_(1-x)Zn_xS thin film were grown on slide glass(corning-2948) substrate using a chemical bath deposition (C.B.D) method. They were annealed at various temperature and X-ray diffraction patterns were measured by X-ray diffractometor in order to study Cd_(1-x)Zn_xS polycrystal structure using extrapolation method of X-ray diffraction patterns for the CdS, ZnS sample annealed in N₂ gas at 550 ℃. It was found hexagonal structure which had the lattice constant a_o = 4.1364Å, c_o=6.7129Å in CdS and a_o = 3.8062Å, c_o = 6.2681 Å in ZnS, respectively. Hall effect on these sample was measured by Van der Pauw method and then studied on carrier density and mobility depending on temperature. We measured also spectral response, sensitivity maximum allowable power dissipation and response time on these sample
홍광준,이상열,유상하,서상석,문종대,신영진,정태수,신현길,김택성,송정훈,유기수 ( K . J . Hong,S . Y . Lee,S . H . You,S . S . Suh,J . D . Moon,Y . J . Shin,T . S . Jeoung,H . K . Shin,T . S . Kim,J . H . Song,K . S . Rheu ) 한국센서학회 1993 센서학회지 Vol.2 No.1
Polycrystalline CdS thin films were grown on ceramic substrate using a chemical bath deposition method. They were annealed at various temperature and X-ray diffraction patterns were measured by X-ray diffractometer in order to study CdS polycrystal structure. Using extrapolation method of X-ray diffraction patterns for the CdS samples annealed in N₂ gas at 5500 it was found hexagonal structure whose lattice constants a_o and c_o were 4.1364 Å and 6.7129 Å, respectively. Its grain size was about 0.35 ㎛. Hall effect on this sample was measured by Van der Pauw method and studied on carrier density and mobility depending on temperature. From Hall data, the mobility was likely to be decreased by piezo electric scattering at temperature range of 33K and 150K and by polar optical scattering at temperature range of 150K and 293K. We measured also spectral response, sensitivity (γ), maximum allowable power dissipation and response time on these samples.
Chemical Bath Deposition 방법으로 제작한 CdSe 박막의 특성
신영진 ( Y . J . Shin ),홍광준 ( K . J . Hong ),이상열 ( S . Y . Lee ),유상하 ( S . H . You ),서상석 ( S . S . Suh ),문종대 ( J . D . Moon ),신현길 ( H . K . Shin ),김택성 ( T . S . Kim ),송정훈 ( J . H . Song ),유기수 ( K . S . R 한국센서학회 1993 센서학회지 Vol.2 No.1
Polycrystalline CdSe thin films were grown on ceramic substrate using a chemical bath deposition (CBD) method. They were annealed at various temperature and X-ray diffraction patterns were measured by X-ray diffractometer in order to study CdSe polycrystal structure. Using extrapolation method of X-ray diffraction patterns for the CdSe samples annealed in N₂ gas at 450℃ it was found hexagonal structure whose lattice parameters a_o and c_o were 4.302 A and 7.014 A, respectively. Its grain size was about 0.3 ㎛. Hall effect on this sample was measured by Van der Pauw method and studied on carrier density and mobility depending on temperature. From Hall data, the mobility was likely to be decreased by piezo electric scattering at temperature range of 33 K and 200 K, and by polar optical scattering at temperature range of 200 K and 293 K. We measured also spectral response, sensitivity (γ), maximum allowable power dissipation and response time on these samples.
몬테카를로 시물레이션에 의한 미소 비커스 경도의 Weibull 통계 해석에 관하여
김선진(S. J. Kim),공유식(Y. S. Kong),이상열(S. Y. Lee) 한국동력기계공학회 2008 한국동력기계공학회 학술대회 논문집 Vol.2008 No.11
In the present study, the Weibull statistical analysis using the Monte-Carlo simulation has been performed to investigate the micro-Virkers hardness measurement reliability considering the variability. Experimental indentation test were performed with a micro-Virkers hardness tester for as-received and quenching and tempering specimens in SCM440 steels. The distribution of micro-Virkers hardness is found to be 2-parameter Weibull distribution function. The mean values and coefficients of variation (COV) for both data set are compared with results based on Weibull statistical analysis. Finally, Monte-Carlo simulation was performed in order to evaluate the effect of sample size on the micro-Virkers hardness measurement reliability. For the parent distribution with shape parameter 30.0 and scale parameter 200.0 (COV=0.040), the number of sample data required to obtain the true Weibull parameters was founded by 20. For the parent distribution with shape parameter 10.0 and scale parameter 200.0 (COV=0.1240), the number of sample data required to obtain the true Weibull parameters was founded by 30.