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인체저항과 전자충격기의 전격(Electric shock) 위험도 비교 검토
이관훈,황순미,정용백 한국신뢰성학회 2021 한국신뢰성학회 학술대회논문집 Vol.2021 No.11
최근 국내에서도 한국형 전자충격기 등 고전압을 이용한 경찰용 전자무기가 많이 개발되고 있다. 이러한 제품들은 제품 자체의 성능, 신뢰성도 중요하지만, 제품이 갖는 인체에 대한 유해성으로 충분한 정도의 전기적 안전성 확보가 무엇보다도 중요하다. 본 발표에서는 인체에 대한 전류의 영향은 IEC-60479 규격을 참조하였으며, 전류에 의한 인체 위험성은 문헌 및 기존 발표 논문 등을 참조하여다. 현재 사용 중인 전자충격기에 대한 규격 비교 검토는 경찰에서 가능 많이 사용하고 있는 Taser사의 X26 모델을 참조하여 인체 유해성 정도를 추정하여 살펴보았고, 그 결과를 설명하고자 한다.
Sn 표면처리된 FR-4 재질 PCB에서의 이온마이그레이션 가속시험
황순미(Soon-Mi Hwang),정용백(Young-baek Jung),김철희(Chul-hee Kim),이관훈(Kwan-Hun Lee) 한국신뢰성학회 2012 신뢰성응용연구 Vol.12 No.3
Recently, as a electronic components are becoming more high-density, so that electronic circuits have smaller pitches between the leads and are more vulnerable to insulation failure. And the reliability of electric insulation has become an ever important issue as device contact pitches and print patterns shrink. Ion migration occurs in highly humid environment as voltage is applied to an installed print circuit. Under highly humid and voltage applied circumstances, electronic components respond to applied voltages by electrochemical ionization of metals, and a conducting filament forms between the anode and cathode across a nonmetallic medium. This leads to short-circuit failure of the electronic component. In thesis, we study acceleration test of ion migration in FR-4 PCB plated with Sn. Voltage applied test of FR-4 PCB circuits plated with Sn was tested in the temperature and humidity environments. As a result of this test, equation of acceleration model was derived.
황순미(Soon Mi Hwang),정용백(Young baek Jung),김철희(Chul hee Kim),이관훈(Kwan Hoon Lee) 한국신뢰성학회 2011 신뢰성응용연구 Vol.11 No.3
Low-noise amplifier(LNA) is a component that amplifies the signal while lowering the noise figure of high-frequency signal. LNA holds a very important position in RF system so that it is widely used for telecommunication. Electro static discharge(ESD) is the most common cause of malfunction for low-powered components, such as Large Scale Integration and IC type LNA is weak in ESD. This thesis studies static effect of communication LNA. It analyzes ESD effect, which occurs within LNA circuit, and describes testing standard and methods. In order to find out LNA"s susceptiblity to electro static, two well-recognized communication IC type LNA models were selected to be tested. Then static-induced malfunction was carefully analyzed and it suggests architectural problem and improvement from the LNA"s ESD point of view.