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변승현(S. H. Byun),조병학(B. H. Cho),신창훈(C. H. Shin),양장범(J. B. Yang) 한국정밀공학회 2004 한국정밀공학회 학술발표대회 논문집 Vol.2004 No.10월
In this paper, a fault diagnosis system for ram in PHWR plant is developed. The developed diagnosis system can detect the ram stuck phenomena due to increased ball wear and damage in ball nut using discrete wavelet transform before the ram is stuck. The validity of developed diagnosis system is shown via experiments using ball nut characteristic test equipment.