http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
( Taehee Kim ),( Yoon Jin Cha ),( Yoon Soo Chang ) 대한결핵 및 호흡기학회 2020 Tuberculosis and Respiratory Diseases Vol.83 No.1
Background: Programmed death-ligand 1 (PD-L1) expression is tested by immunohistochemistry (IHC)―22C3, SP263, and SP142. The aim of this study is to evaluate the correlation among the three methods of PD-L1 IHC in non-small cell lung cancer (NSCLC) and clinical significance of PD-L1 expression in lung adenocarcinoma with an epidermal growth factor receptor (EGFR)-tyrosine kinase domain mutation. Methods: The results of 230 patients who were pathologically confirmed as having NSCLC; tested using PD-L1 IHC 22C3, SP263, and SP142 methods; and evaluated via the peptide nucleic acid clamping method to confirm EGFR mutation, were analyzed in this study. Results: 164 patients underwent both the SP263 and 22C3 tests. There was a significant positive correlation between the outcomes of the two tests (Spearman correlation coefficient=0.912, p<0.001), with a derived regression equation as follows: 22C3=15.2+0.884×SP263 (R<sup>2</sup>=0.792, p<0.001). There was no relationship between the expression of PD-L1 and clinical parameters, including EGFR-tyrosine kinase inhibitor (TKI) mutation. The PD-L1 expression in patients treated with EGFR-TKI yielded a 2-month-shorter progression period than that in the PD-L1-negative group. However, this did not reach statistical significance (PD-L1<1% vs. PD-L1≥1%, 10 months vs. 8 months). Conclusion: The results of the 22C3 and those of SP263 methods were in good correlation with one another. Since the PD-L1 expression is not influenced by the EGFR mutation, it is necessary to perform a PD-L1 test to set the treatment direction in the patients with EGFR-mutant NSCLC.
Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios
Taehee Lee,Touba, Nur A.,Joon-Sung Yang IEEE 2017 IEEE transactions on computer-aided design of inte Vol.36 No.9
<P>Scan test data compression is widely used in industry to reduce test data volume (TDV) and test application time (TAT). This paper shows how multiple scan chain expansion ratios can help to obtain high test data compression in system-on-chips. Scan chains are partitioned with a higher expansion ratio than normal in scan compression mode and then are gradually con-catenated based on a cost function to detect any faults that could not be detected at the higher expansion ratios. It improves the overall test compression ratio since it potentially allows faults to be detected at the highest expansion ratio. This paper introduces a new cost function to choose scan chain concatenation candidates for concatenation for multiple expansion ratios. To avoid TDV and TAT increase by scan concatenation, the proposed method takes a logic structure and scan chain length into consideration. Experiment results show the proposed method reduces TAT and TDV by 53%-64% compared with a traditional scan compression method.</P>