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Minseok Jo,Man Chang,Seonghyun Kim,Hyung-Suk Jung,Rino Choi,Hyunsang Hwang IEEE 2009 IEEE electron device letters Vol.30 No.3
<P>Negative bias temperature instability (NBTI) in MOSFETs with high-dielectric-constant (<I>k</I>) gate dielectrics has been investigated using a novel pulse NBTI measurement technique. This technique enabled the separation of the contribution of interface states (<I>N</I> <SUB>it</SUB>) from that of oxide traps (<I>N</I> <SUB>ot</SUB>) to NBTI behavior by varying the measurement time (<I>t</I> <SUB>m</SUB>) and the delay time (<I>t</I> <SUB>R</SUB>). The technique was demonstrated on devices fabricated with different postdeposition annealing (PDA) conditions. It was found that, regardless of the PDA condition, the <I>N</I> <SUB>ot</SUB> in high-<I>k</I> dielectric was more responsible for the NBTI behavior than the <I>N</I> <SUB>it</SUB>, but the contribution of <I>N</I> <SUB>it</SUB> to NBTI increased as the stress continued because the generation rate of <I>N</I> <SUB>it</SUB> was higher than that of <I>N</I> <SUB>ot</SUB>.</P>
Minseok Jo,Seonghyun Kim,Seungjae Jung,Ju-Bong Park,Joonmyoung Lee,Hyung-Suk Jung,Choi, R.,Hyunsang Hwang IEEE 2010 IEEE electron device letters Vol.31 No.4
<P>The effect of fast components in the threshold-voltage shift (¿V<SUB>th</SUB>) induced by electrical stress on the lifetime of bias temperature instability (BTI) is investigated in metal-oxide-semiconductor field-effect transistors with high-k gate dielectrics using dc and pulsed measurements. The empirical results confirm that the initial fast ¿V<SUB>th</SUB> (¿V<SUB>th,fast,ini</SUB>.) does not contribute to long-term device degradation under operating voltage conditions. Therefore, ¿V<SUB>th</SUB> is corrected by eliminating the initial ¿V<SUB>th,fast,ini</SUB>. With this adjustment, the effect of measurement time (t<SUB>m</SUB>) on the corrected ¿V<SUB>th</SUB> (¿V<SUB>th,corr</SUB>.) is negligible. However, compared with the lifetime estimates made using ¿V<SUB>th,corr</SUB>., the dc measurements still tend toward overestimation under low voltage stress because of the ¿V<SUB>th,fast,str</SUB>. component induced by stress (not the initial ¿V<SUB>th,fast,ini</SUB>.)In conclusion, it may be stated that the ¿V<SUB>th,fast,str</SUB>. component could play a critical role in BTI tests conducted under operating voltage conditions.</P>
Characteristics of Traps Induced by Hot Holes Under Negative-Bias Temperature Stress in a pMOSFET
Minseok Jo,Man Chang,Seonghyun Kim,Seungjae Jung,Ju-Bong Park,Joonmyoung Lee,Dong-Jun Seong,Hyunsang Hwang IEEE 2009 IEEE electron device letters Vol.30 No.11
<P>We investigated the generation and recovery process of traps in pMOSFETs under negative-bias temperature (NBT) stress by using pulsed and dc measurements. The behavior of generated traps was studied as a function of applied body bias (<I>V</I> <SUB>B</SUB>). The fast components induced with the application of a positive <I>V</I> <SUB>B</SUB> were independent of measurement time (<I>t</I> <SUB>m</SUB>), while the results from devices with no applied <I>V</I> <SUB>B</SUB> showed a strong dependence on <I>t</I> <SUB>m</SUB>. This suggests that the fast components of additional traps generated by a positive <I>V</I> <SUB>B</SUB> can be attributed to interface states (<I>N</I> <SUB>it</SUB>) at the Si/SiO<SUB>2</SUB> interface. Based on the results of recovery characteristics with an intentional measurement delay, the recovery of <I>N</I> <SUB>it</SUB> is relatively slow, initiating on the scale of a few milliseconds.</P>
Jo, Gunho,Hong, Woong-Ki,Sohn, Jung Inn,Jo, Minseok,Shin, Jiyong,Welland, Mark E.,Hwang, Hyunsang,Geckeler, Kurt E.,Lee, Takhee WILEY-VCH Verlag 2009 Advanced Materials Vol.21 No.21
<B>Graphic Abstract</B> <P>A new layout of complementary logic circuits based on p-channel carbon nanotube and n-channel zinc oxide nanowire transistors is presented, providing a hybrid approach to combine advantageous characteristic functions for the modulation of the current and operating voltage in transistors through proton radiation-generated charges, which allow a simple way to design favorable logic circuits. <img src='wiley_img/09359648-2009-21-21-ADMA200803510-content.gif' alt='wiley_img/09359648-2009-21-21-ADMA200803510-content'> </P>
조민석(Minseok Jo),심재경(Jaekyung Shim),곽승우(Seungwoo Kwak),임득재(Deukjae Im),나병철(Byungchul Na) (사)한국CDE학회 2014 한국 CAD/CAM 학회 학술발표회 논문집 Vol.2014 No.2
Diesel fuel injectors work by transferring fuel from the supply line to the fuel injector device which is attached to each cylinder where it is pressurized and then sprayed through a small nozzle into the cylinder"s combustion chamber. While a diesel fuel injector working, the highly pressurized fuel inside the fuel passage can cause the stress and deformation of parts of the injector and by extension, it may be a cause of malfunction of the injector. In this paper, the stress distribution and deformation of a 2,000bar diesel fuel injector model2 are analyzed using finite element method and compared with model1 for suggestion of better design.
조민석(Minseok Jo),정원석(Wonsuk Chung),김태형(Taehyung Kim),홍대식(Daesik Hong) 대한전자공학회 2016 대한전자공학회 학술대회 Vol.2016 No.6
This paper considers a data transmission for driving information of the bicycle which harvests the energy from the hub dynamo. We analyze the impact of the bicycle speed on the transmission reliability and presented the trade-off relationship between the amount of the harvested energy and the coherence time of the channel. Based on this analysis, we propose the data transmission strategy which improves the transmission reliability performance by setting the threshold energy and introducing the adaptive channel estimation period.
조민석(Minseok Jo),심재경(Jaekyung Shim),곽승우(Seungwoo Kwak),임득재(Deukjae Im),나병철(Byungchul Na) (사)한국CDE학회 2013 한국 CAD/CAM 학회 학술발표회 논문집 Vol.2013 No.8
A fuel injector is an automotive part that supplies fuel into the cylinders of an internal combustion engine. An injector, in general, consists of various parts such as control valve bodies, pistons, needles, nozzle bodies, and bodies inside of which have fuel passage where highly pressurized fuel passes through. The pressurized fuel inside the fuel passage causes stresses and deformations of the bodies and parts of the injector, which may result in the failure or malfunction of the injector. In this paper, the stress distribution and deformation of a 2,000bar diesel fuel injector bodies are analyzed using finite element method.
( Minseok Yoon ),( Jin Soo Kim ),( Dongsoo Kim ),( Jinho Jo ),( Suengmok Cho ) 한국수산과학회(구 한국수산학회) 2014 Fisheries and Aquatic Sciences Vol.17 No.2
Surimi (or fish paste) products are one of the most representative processed seafoods in Korea. In a previous study, we evaluated the potential use of rice flour as an agent to replace wheat flour in surimi products. In this study, we optimized the content of rice flour and water in surimi products using response surface methodology. Rice flour content (X1, w/w) and water content (X2, v/w) were chosen as independent variables and gel strength (Y1) and overall acceptance (Y2) as dependent variables. Optimal conditions of X1 and X2 were 14% and 9.1%, respectively, and the predicted values of the multiple response optimal conditions were Y1 = 656.4 (g.cm) and Y2 = 6.34. Under optimal conditions, the experimental values of Y1 and Y2 were 647.8 (g.cm) and 6.21, respectively, which were similar to the predicted values. Surimi products that are prepared under optimum conditions were similar in gel strength to those of commercial products. However, its sensory evaluation score was higher than that of the commercial products. In conclusion, rice flour can not only be used as an alternative to wheat flour, but it also can be used to improve the quality of surimi products.