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K-means 클러스터링을 이용한 케이블 접속재 계면결함의 부분방전 분포 해석
조경순,홍진웅,Cho, Kyung-Soon,Hong, Jin-Woong 한국전기전자재료학회 2007 전기전자재료학회논문지 Vol.20 No.11
To investigate the influence of partial discharge(PD) distribution characteristics due to various defects on the power cable joints interface, we used the K-means clustering method. As the result of PD number(n) distribution analyzing on $\Phi-n$ graph, the phase angle($\Phi$) of cluster centroid shifted to $0^{\circ}\;and\;180^{\circ}$ increasing with applying voltage. It was confirmed that the PD quantify(q) and euclidean distance of centroid were increased with applying voltage from the centroid distribution analyzing of $\Phi-q$ plane. The dispersion degree was increased with calculated standard deviation of the $\Phi-q$ cluster centroid. The PD number and mean value on $\Phi-q$ graph were some different by electric field concentration with defect types.
전력케이블 접속재 XLPE/EPDM 계면의 부분방전 특성
조경순,홍진웅,Cho, Kyung-Soon,Hong, Jin-Woong 한국전기전자재료학회 2007 전기전자재료학회논문지 Vol.20 No.9
This paper describes the influence on partial discharge characteristics of defects at the model XLPE/EPDM interfaces of power cable joints. The defects of void and copper which could inadvertently be present at the joint interface. We measured ${\Phi}-n,\;{\Phi}-q$ patterns by a computer-aided partial discharge measuring system. Several parameters i, e, maximum discharge $q_{max}$ [pC], average discharge q [pC/cycle], and average angle of discharge ${\Theta}g$ [deg] were found to depend upon the defect type varying applied voltage. As the result of time evaluation, partial discharges are small different at copper defects, but is decreasing obviously about 20 minutes at void defect. It considered that difference of magnitude of total positive discharge of Q+ [pC] and total negative discharge of Q- [pC] is SPMD(swarming pulsive micro discharges).
조경순,이강원,김원종,홍진웅,신종열,Cho, Kyung-Soon,Lee, Kang-Won,Kim, Won-Jong,Hong, Jin-Woong,Shin, Jong-Yeol 한국전기전자재료학회 2008 전기전자재료학회논문지 Vol.21 No.4
Most of the high voltage insulation systems, such as the power cable joint having hetero interface, are composed of more than two different insulators to improve insulating performance. The partial discharge(PD) in these hetero interface is expected to affect the total insulation performance. Thus, it is important to study electrical properties on these interfaces. This study described the influence of copper and semiconductive substance defects on $\Phi$-q-n distribution between the interface of the model cable joints to classify PD source. PD was sequentially detected for 600 cycles of the applied voltage. The K-means cluster analysis has been analyzed to investigate the $\Phi$-q-n distribution. The skewness-kurtosis(Sk-Ku) plot from K-means clustering results was defined to quantify cluster distribution and classify distribution patterns. The Sk-Ku plot is composed of skewness and kurtosis along abscissa and ordinate which indicate the asymmetry and the sharpness of distribution. As a result of the Sk-Ku plot, it was confirmed that the data was distributed in 1st 2nd and 3rd quadrant at copper foreign substance defect, but in case of semiconductive foreign substance, the data was distributed in 2nd quadrant only.