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김창석,최창주,이우선,오무송,김태성,김병인 조선대학교 에너지.자원신기술연구소 2001 에너지·자원신기술연구소 논문지 Vol.23 No.2
In this study, ZnO is evaporated to be coated on n-type Si wafer substrate. Refractive coefficient of thin film that is evaporating TiO₂onto ZnO increases linearly as thickness is getting thinner to have high value and high angle and it satisfies theoretical equation I(x)=Io exp (-αx) theory that represents the strength of photon energy advancing through ZnO thin film. And dielectric constant of TiO₂thin film evaporated onto ZnO is high and ε₂ is smaller than ε₁. The specimen TiO₂thin film evaporated onto ZnO has much higher dielectric constant when photon energy is increased.