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내부 전류 테스팅을 위한 내장형 전류감지기의 설계 및 구현
송근호,방만식,이효상,서정훈,김강철,한석붕 慶尙大學校 工科大學 自動化및컴퓨터應用技術硏究所 1997 自動化 및 컴퓨터應用技術 Vol.4 No.1
This paper proposes a new BIC(Built-in Current sensor) for the internal current test in CMOS logic circuits. Our BIC is composed of current sensor, level shifter, comparator, and reference voltage circuit. The current sensor parallel connected with one diode and one nMOS device can convert the current of CUT(Circuit Under Test) to voltage. A single phase clock is employed in the BIC reduce the control circuitry of it and to perform a self-testing for a faulty current. The proposed BIC is verified by using the HSPICE simulator and fabricated in 0.8 ㎛ twin-tub process. The CUT is 4 bit full adder with bridging faults. The realized BIC successfully detects all bridging faults in CUT.