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장용훈(YongHoon Jang) 대한기계학회 2003 대한기계학회 춘추학술대회 Vol.2003 No.11
The flow of electrical current through a microscopic actual contact spot between two conductors is<br/> influenced by the flow through adjacent contact spots. A smoothed version of this interaction effect is<br/> developed and used to predict the contact resistance when the statistical size and spatial distribution of<br/> contact spots is known. To illustrate the use of the method, an idealized fractal rough surface is<br/> defined using the random midpoint displacement algorithm and the size distribution of contact spots is<br/> assumed to be given by the intersection of this surface with a constant height plane. With these<br/> assumptions, it is shown that including finer scale detail in the fractal surface, equivalent to reducing<br/> the sampling length in the measurement of the surface, causes the predicted resistance to approach the<br/> perfect contact limit.