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유동수(D. S. Ryu),임재훈(J. H. Lim),우성우(S. W. Woo),이덕보(D. B. Lee) 한국동력기계공학회 2005 한국동력기계공학회 학술대회 논문집 Vol.- No.-
The data of failed product in marketplace is very important one which understands the use environment of customer. To improve reliability of the product, the failure analysis of the product should be performed. In this study, we investigate the failure mode of helix ice dispenser in side by side refrigerator. To perform failure reproduce examination of helix ice dispenser, accelerative life test(ALT) was adopted. The result of ALT was identical with failure of the helix in marketplace. The cause of failure in helix ice dispenser was cracked and fractured by helix upper made of polycarbonate. The design of helix upper and blade dispenser was modified. The helix dispenser with new design could guarantee 14.8 years of B₁ life under worst conditions.
이덕보(D. B. Lee),김정현(J. H. Kim),강수근(S. K. Kang),김상도(S. D. Kim),장석원(S. W. Chang),임재훈(J. H. Lim),유동수(D. S. Ryu) 대한기계학회 2005 대한기계학회 춘추학술대회 Vol.2005 No.5
In evaluation of electronic reliability on the PCB(Printed Circuit Board),electrochemical migration is one of main test objects. The phenomenon of electrochemical migration occurs in the environment of the high humidity and the high temperature under bias through a continuous aqueous electrolyte. In this paper, the generating mechanism of electrochemical migration is investigated by using water drop acceleration test under various waters. The waters used in the water drop test are city water, distilled water and ionic water. It found that the generated velocity of electrochemical migration depended on the temperature of water and the electrolyte quantity which included in the various waters.
이덕보(D. B. Lee),김정현(J. H. Kim),강수근(S. K. Kang),조영진(Y. J. Cho),장석원(S. W. Chang),임재훈(J. H. Lim),유동수(D. S. Ryu) 대한기계학회 2005 대한기계학회 춘추학술대회 Vol.2005 No.5
The opening test of a filament is very important for the reliability of fluorescent lamps. Failure mechanisms of filament in fluorescent lamps are investigated by the filament accelerated stress test and voltage accelerated stress test. The characteristics of the accelerated test data are also compared with those of field data. The failure sites of filament in fluorescent lamp were occurred at the middle part of filament due to radiant heat and the edge part of filament due to torsional stress caused by thermal stress. It found that the life time of fluorescent lamp was effected by the cooling time and the structure of filament.