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In this paper, we analyzed the cause of PD occurred in the Solid insulated Load Break Switchgear (S-LBS). The PD pulse generated by void, ground fault and corona was measured by coupling capacitor. The DIV (Discharge Inception Voltage), phase and pulse magnitude were used for analysis and classification.
This paper shows the temperature rise of the high voltage GIS bus bar. The temperature rise in GIS bus bar is due to Joule's losses in the conductor and the induced eddy current in the tank. The power losses of a bus bar calculated from the magnetic field analysis are used as the input data for the thermal analysis to predict the temperature. The required analysis is a couple-field Multiphysics that accounts for the interactions between three-dimensional AC harmonic magnetic and fluid fields. The heat transfer calculation using the fluid analysis is done by considering the natural convection and the radiation from the tank to the atmosphere. Consequently, because temperature distributions by couple-field Multiphysics (coupled magnetic-fluid) have good agreement with results of temperature rise test, the proposed couple-field Multiphysics technique is likely to be used in a conduction design of the single-pole and three pole-encapsulated bus bar in GIS.
GIS(Gas-Insulated Switchgear) which utilize SF? gas for an insulation may be exploded because of pressure and temperature rise due to the internal arc fault if a short-circuit accident is occurred. The protection against an internal arc fault is provided by a high safety margin between design and bursting pressure and by the application of pressure relief devices which is based on the knowledge of simulated pressure rise. This paper describes the prediction of the pressure and carries out the actual test.
In this paper, mechanical reliability(Life-time) estimation method for 25.8kV SIS(Solid Insulated Switchgear) has been studied. Recently enacted KEPCO's standard includes clause that have to submit a warrantable reliability data for life-time(over B10 25 years) of an epoxy-solid insulating material. Accordingly, this research was carried out on the ALT(Accelerated Life Test) and Life-Estimation method for SIS's insulating material. Mechanical life-time estimation for SIS's insulating material is to verify reliability for tensile creep & fatigue stress, which is the major mechanical stress of SIS. This study proved that SIS's reliability for mechanical stress and established that confidence for estimation results in further verification test.