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DUSCH, E.,DORVAL, T.,VINCENT, N.,WACHSMUTH, M.,GENOVESIO, A. Blackwell Publishing Ltd 2007 Journal of microscopy Vol.228 No.2
<P>Summary</P><P>Point Spread Function (PSF) modelling is an important task in image formation analysis. In confocal microscopy, the exact PSF is rarely known, thus one has to rely on its approximation. An initial estimation is usually performed experimentally by measuring fluorescent beads or analytically by studying properties of the optical system. Yet, fluorescent line-scanning confocal microscopes are not widespread; therefore, very few adapted models are available in the literature. In this paper, we propose an analytical PSF model for line-scanning confocal microscopes. Validation is performed by measuring the error between our model and an experimental PSF measured with fluorescent beads, assumed to represent the real PSF. Comparison with existing models is also presented.</P>
HCS-Analyzer: open source software for high-content screening data correction and analysis.
Ogier, Arnaud,Dorval, Thierry Oxford University Press 2012 Bioinformatics Vol.28 No.14
<P>High-throughput screening is a powerful technology principally used by pharmaceutical industries allowing the identification of molecules of interest within large libraries. Originally target based, cellular assays provide a way to test compounds (or other biological material such as small interfering RNA) in a more physiologically realistic in vitro environment. High-content screening (HCS) platforms are now available at lower cost, giving the opportunity for universities or research institutes to access those technologies for research purposes. However, the amount of information extracted from each experiment is multiplexed and hence difficult to handle. In such context, there is an important need for an easy-to-use, but still powerful software able to manage multidimensional screening data by performing adapted quality control and classification. HCS-analyzer includes: a user-friendly interface specifically dedicated to HCS readouts, an automated approach to identify systematic errors potentially occurring during screening and a set of tools to classify, cluster and identify phenotypes of interest among large and multivariate data.</P>
A. Hendaoui,N. Émond,S. Dorval,M. Chaker,E. Haddad 한국물리학회 2013 Current Applied Physics Vol.13 No.5
This work involves the study of the positive emittance-switching (i.e. emittance that increases with increasing the temperature) of thermochromic VO2 films deposited using reactive pulsed laser deposition (RPLD) on Al substrates. The temperature dependence of the emittance of a 260 nm-thick VO2 film on Al substrate revealed a maximum of the emittance of 0.29 around 68 C. It is attributed to an increase in the infrared radiation absorption by the VO2 film due to the coexistence of both insulating and metallic phases in the vicinity of the transition temperature of VO2. The emittance tunability between 25 C and 68 C is 0.21. Since practical SRD application requires both high emittance at high temperature and large tunability, we demonstrate, by both simulation and fabrication, that these goals can be accomplished to some extent by a top dielectric a-Si:H/SiO2 l/4 stack layer. In fact, the addition of a-Si:H/SiO2 l/4 overlayer results in an increase of the maximum value of the emittance by 114% (from 0.29 to 0.62) as well as an increase of the tunability by 81% (from 0.21 to 0.38). This work reports an important improvement of the positive emittance-switching efficiency of the VO2-based structures and holds promise for a new generation of smart radiator devices (SRDs) for a passive thermal control of spacecrafts.