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초미세 결정립 구조를 갖는 OFHC Cu 대형봉재의 미세조직 및 기계적 특성
박경태(K.-T. Park),박이주(L. J. Park),김형원(H. W. Kim),황시우(S.W. Hwang),지정훈(J.H. Ji),이종수(C.S. Lee) 한국소성가공학회 2011 한국소성가공학회 학술대회 논문집 Vol.2011 No.5
Bars of OFHC Cu with the diameter of 45mm were processed by equal channel angular pressing up to 16 passes via route Be, and homogeneity of their microstructrues and mechanical properties was examined at every four passes which develop the equiaxed ultrafine grains. Cross-sectional hardness exhibited a concentric distribution. Hardness was the highest at the center of bar and it decreased gradually from center to surface. After 16 passes, overall hardness decreased due to recovery and partial recrystallization. Regardless of the number of passage, yield strength and tensile strength were quite uniform at all positions, but elongation showed some degree of scattering. At 4 passes, coarse and ultrafine grains coexisted at all positions. After 4 passes, uniform equiaxed ultrafine grains were obtained at the center, while uniform elongated ultrafine grains were manifested at the upper half position. At the lower half position, grains were equiaxed but its size was inhomogeneous. It was found that inhomogeneity of grain morphology and grain size distribution at different positions are to be attributed to scattering in elongation but they did not affect strength.
마이크로 팩토리 장착형 Vision/Inspection 시스템 개발
이득우(D. W. Lee),김형원(H. W. Kim),김은영(E. Y. Kim),이채문(C. M. Lee),박정우(J. W. Park) 한국생산제조학회 2005 한국생산제조시스템학회 학술발표대회 논문집 Vol.2005 No.10
This paper demonstrates the vision/inspection system mounted in micro-factory system. To insure the topographical data of micro parts produced by micro-factory system, it is necessary to scan precisely with miniatured CMM (Coordinate Measuring Machine) system. Miniaturized CMM essentially consists of metrology frame, nano stage for x, y, z movement, nano probe for scanning and scratching, and inchworm actuator for operating nano stage. Nano stage with piezo-actuated inchworm system enables micro parts to travel wide range in nanometer range.