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$\bar{x}$ 관리도의 표준관리한계와 부트스트랩 백분률 관리한계의 수행도 비교평가
송서일,이만웅 한국산업경영시스템학회 1999 한국산업경영시스템학회지 Vol.22 No.52
Statistical Process Control(SPC) which uses control charts is widely used to inspect and improve manufacturing process as a effective method. A parametric method is the most common in statistical process control. Shewhart chart was made under the assumption that measurements are independent and normal distribution. In practice, this assumption is often excluded, for example, in case of (equation omitted) chart, when the subgroup sample is small or correlation, it happens that measured data have bias or rejection of the normality test. A bootstrap method can be used in such a situation, which is calculated by resampling procedure without pre-distribution assumption. In this study, applying bootstrap percentile method to (equation omitted) chart, it is compared and evaluated standard process control limit with bootstrap percentile control limit. Also, under the normal and non-normal distributions, where parameter is 0.5, using computer simulation, it is compared standard parametric with bootstrap method which is used to decide process control limits in process quality.
VSI ${\overline{X}}$-CRL 합성관리도의 경제적 설계
송서일,박현규,정혜진,Song, Suh-Ill,Park, Hyun-Kyu,Jung, Hey-Jin 한국산업경영시스템학회 2005 한국산업경영시스템학회지 Vol.28 No.4
This paper is designed a VSI ${\overline{X}}$-CRL synthetic control chart in aspect of economy. We found the optimal sampling interval and various control limit factors under various cost parameters using cost function, proposed Lorenzen and Vance. Optimal design parameters include the sample size, control limit width, sampling interval, CRL/S chart control limit; L. Comparison and analysis of cost parameters are applied between synthetic VSI ${\overline{X}}$-CRL chart and FSI ${\overline{X}}$-CRL chart. The result of this paper shows that VSI ${\overline{X}}$-CRL chart brings cost-cutting effect of 3.04% control expense less than FSI control chart. It may not be difficult to establish the optimal economic control parameters to apply the practical cost parameters in the field.
공정개선 의사결정을 위한 VSI X 관리도의 경제적 설계
송서일,김재호,정혜진 한국품질경영학회 2007 품질경영학회지 Vol.35 No.2
Today, the statistical process control (SPC) in manufacture environment is an important role at the process by the productivity improvement of the manufacturing systems. The control chart in this statistical method is widely used as an important statistical tool to find the assignable cause that provoke the change of the process parameters such as the mean of interest or standard deviation. But the traditional SPC don’t grasp the change of process according to the points fallen the near control limits because of monitoring the variance of process such as the fixed sampling interval and the sample size and handle the cost of the aspect of these sample point. The control chart can be divided into the statistical and economic design. Generally, the economic design considers the cost that maintains the quality level of process. But it is necessary to consider the cost of the process improvement by the learning effects. This study does the economic design in the VSI control chart and added the concept of loss function of Taguchi in the cost model. Also, we proved that the VSI control chart is better than the FSI in terms of the economic aspects and proposed the standard of the process improvement using the VSI control chart.
송서일,이보근 동아대학교 공과대학부설 생산기술연구소 1997 生産技術硏究所硏究論文集 Vol.2 No.2
The process incapability index intended to estimate the process capability by measuring process incapability provides more detailed information to evaluate the process capability by dividing information about the process mean and variance. But it is very difficult to evaluate the process capability accurately when the target value is not consistent with the center of specification, and the shape of distribution is changed. The proposed incapability index, in this paper, is specifically designed to help of control skewness-prone manufacturing processes typified by a hole-drilling and/or punching process. It is more sensitive to skewness and changes in the shape of distribution. Hence the proposed incapability index is very useful for monitoring mear-normal processes where loss of capability typically lead to asymmetry.
공정개선 의사결정을 위한 VSI $\bar X$ 관리도의 경제적 설계
송서일,김재호,정혜진,Song, Suh-Ill,Kim, Jae-Ho,Jung, Hey-Jin 한국품질경영학회 2007 품질경영학회지 Vol.35 No.2
Today, the statistical process control (SPC) in manufacture environment is an important role at the process by the productivity improvement of the manufacturing systems. The control chart in this statistical method is widely used as an important statistical tool to find the assignable cause that provoke the change of the process parameters such as the mean of interest or standard deviation. But the traditional SPC don't grasp the change of process according to the points fallen the near control limits because of monitoring the variance of process such as the fixed sampling interval and the sample size and handle the cost of the aspect of these sample point. The control chart can be divided into the statistical and economic design. Generally, the economic design considers the cost that maintains the quality level of process. But it is necessary to consider the cost of the process improvement by the learning effects. This study does the economic design in the VSI $\bar X$ control chart and added the concept of loss function of Taguchi in the cost model. Also, we preyed that the VSI $\bar X$ control chart is better than the FSI $\bar X$ in terms of the economic aspects and proposed the standard of the process improvement using the VSI $\bar X$ control chart.