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외래환자 진료 프로세스를 위한 인터넷 기반 Generic 시뮬레이션 모델
구정인(Jeongin Koo),이기호(Giho Lee),이종성(Jongsung Lee),이홍(Hong Li),김병인(Byung-In Kim) 한국경영과학회 2012 韓國經營科學會誌 Vol.37 No.4
This paper introduces an Internet based generic simulator for outpatient clinics, named PIOS (Postech Internetbased Outpatient Simulator). Unlike other simulation tools, PIOS is operated on the Internet, is straightforward to use for outpatient process analysis, and is open to public via http://logistics.postech.ac.kr/pios with free of charge. Therefore, non simulation expert users such as hospital administrators and managers can easily access to PIOS and conduct simulation study by themselves. In this paper, we describe the main components and programming logic of PIOS, and demonstrate its validity by comparing the output results of PIOS and a commercial software package.
이미지 피라미드와 중첩을 활용한 영상처리 기반의 인덱서블 엔드밀 공구마모영역 및 마모최대폭 측정기법
고형용(Hyoung Yong Ko),구정인(Jeongin Koo) 한국생산제조학회 2021 한국생산제조학회지 Vol.30 No.1
Because the condition of machining tools has a significant influence on the machine downtime and the quality of machining products, maintaining it is the most important aspect in machining. This paper presents the detection process of the tool wear area and its maximal length based on image processing techniques. After collecting tool images from microscopes on the machine, we extracted region of interest (RoI) from them. Subsequently, we applied median filter, Sobel and Otsu method to RoI images to detect the flank wear area of them. To verify our proposed method, we compared it with the human measurement and image processing techniques proposed by prior literatures. Our experimental results were at least 6.7% more accurate because we used overlaid unworn tool images taken previously . With these techniques, we were able to detect tool wear area and its maximal length even for the worn tool wear area of curved surfaces.
A Layout- and Data-Driven Generic Simulation Model for Semiconductor Fabs
Byung-In Kim,Sangwon Jeong,Jaejoon Shin,Jeongin Koo,Junjae Chae,Sujeong Lee IEEE 2009 IEEE transactions on semiconductor manufacturing Vol.22 No.2
<P>Simulation has drawn much attention as an analysis tool because it is often the only tool that has the capability of modeling the details of the semiconductor lines. However, building a simulation model of a semiconductor line is time-consuming and error-prone because of the complexity of the line. This paper proposes a generic simulation modeling framework to reduce the simulation model build time. The framework consists of a layout modeling software called AutoLay and a data-driven generic simulation model called AutoLogic. It can be used to develop an integrated simulation model of production processes and material handling processes in a short period of time. Early users of our framework reported that the initial model building time was reduced from two weeks to a half day.</P>