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Strain imaging of a Cu_2S switching device
Keiji Takata,Ryota Tamura,Toshihiro Kasama,Masataka Fukuyama,Shin Yokoyama,Hiroshi Kajiyama 한국물리학회 2011 Current Applied Physics Vol.11 No.6
Strain imaging of electrochemical behavior of a solid electrolyte Cu_2S in switching devices for nonvolatile memories is presented. The precipitation and dissolution of Cu, and the nonstoichiometry changes cause changes in volume. Strain imaging we have proposed detects the volume changes through the surface displacements using scanning probe microscopy and provides high resolution images. We observed the distributions of the electrochemical reactions in Cu_2S and located the Cu bridges causing switching.
Aggregation States of Polyamide 4 Thin Films under an Aqueous Environment
Shunta Tamura,Haruki Mokudai,Takashi Masaki,Norifumi L. Yamada,Hisao Matsuno,Keiji Tanaka 한국고분자학회 2021 한국고분자학회 학술대회 연구논문 초록집 Vol.46 No.2
Polyamide 4 (PA4) having only four carbons between neighboring amide groups exhibits enhanced biodegradability, and thus, has been studied as one of candidates for eco-friendly structural materials. However, the biodegradation mechanism for PA4 is far clear for a moment. We here examined the aggregation states of PA4 thin films coated on a hydrophobized SiOx substrate using atomic force microscopy (AFM) and neutron reflectivity (NR) analyses in air and water environments. AFM observation revealed that the outermost surface of the PA4 film was featureless and flat at a nanometer level. Once the film was immersed into water, the thickness increased by approximately 1.1 times. NR made it clear that the PA4 film was swollen due to the water sorption in the film, and that there existed multiple layers having different densities along the direction normal to the interface. Effect of annealing temperature on such the aggregation states and the degradability will be also discussed.
Inada, Hiromi,Hirayama, Yoichi,Tamura, Keiji,Terauchi, Daisuke,Namekawa, Ryoji,Shichiji, Takeharu,Sato, Takahiro,Suzuki, Yuya,Ohtsu, Yoshihiro,Watanabe, Keitaro,Konno, Mitsuru,Tanaka, Hiroyuki,Saito, Korean Society of Microscopy 2015 Applied microscopy Vol.45 No.1
We have developed a new HD-2700 (Hitachi High-Technologies Corp., Japan) scanning transmission electron microscope (STEM) that includes an automatic aberration correction function, and a large-solid-angle energy-dispersive X-ray spectroscopy detector that enables high-resolution and sensitive analysis. For observation with atomic resolution, using spherical-aberration-corrected STEM, in order that satisfactory performance of the device can be achieved readily, and within a short time, irrespective of the operator's skill level, a spherical-aberration-correction device with an automatic aberration-correction function was developed. This automatic aberration-correction function carries out the entire correction-related process (aberration measurement, selection and correction) automatically, with automatic selection of the aberrations that require correction, and automatic measurement of the appropriate corrections.