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金秀東,權赫茂,張忠根 충남대학교 자연과학연구소 1981 忠南科學硏究誌 Vol.8 No.1
The relation between phase transformation and optical micrograph differential thermal analysis and electrical resistivity in cu-Al alloys have been investigated as a function of temperature in the range of 400-750C at the composition range of 11.8-15.0 wt, pct. Aluminum. The electrical resistivity and D.T.A. results of the alloys were in good agreement with the phase transformations.