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Kyoman Kang,Hanwool Jeong,Younghwi Yang,Juhyun Park,Kiryong Kim,Seong-Ook Jung IEEE 2016 IEEE transactions on very large scale integration Vol.24 No.4
<P>The previously proposed average-8T static random access memory (SRAM) has a competitive area and does not require a write-back scheme. In the case of an average-8T SRAM architecture, a full-swing local bitline (BL) that is connected to the gate of the read buffer can be achieved with a boosted wordline (WL) voltage. However, in the case of an average-8T SRAM based on an advanced technology, such as a 22-nm FinFET technology, where the variation in threshold voltage is large, the boosted WL voltage cannot be used, because it degrades the read stability of the SRAM. Thus, a full-swing local BL cannot be achieved, and the gate of the read buffer cannot be driven by the full supply voltage (V-DD), resulting in a considerably large read delay. To overcome the above disadvantage, in this paper, a differential SRAM architecture with a full-swing local BL is proposed. In the proposed SRAM architecture, full swing of the local BL is ensured by the use of cross-coupled pMOSs, and the gate of the read buffer is driven by a full V-DD, without the need for the boosted WL voltage. Various configurations of the proposed SRAM architecture, which stores multiple bits, are analyzed in terms of the minimum operating voltage and area per bit. The proposed SRAM that stores four bits in one block can achieve a minimum voltage of 0.42 V and a read delay that is 62.6 times lesser than that of the average-8T SRAM based on the 22-nm FinFET technology.</P>
Switching pMOS Sense Amplifier for High-Density Low-Voltage Single-Ended SRAM
Hanwool Jeong,Taewon Kim,Kyoman Kang,Taejoong Song,Gyuhong Kim,Hyo-sig Won,Seong-Ook Jung IEEE 2015 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS PART 1 R Vol.62 No.6
<P>A switching pMOS sense amplifier (SPSA) is proposed for high-speed single-ended static RAM sensing. By using the same pull-up pMOS transistor for sensing and precharging the bit-line, the performance is enhanced, and the power consumption is reduced. A keeper that compensates bit-line leakage is also employed, and a minimum operating voltage of 0.51 V is obtained. Compared to the previous dynamic pMOS sense amplifier and AC-coupled sense amplifier (ACSA), the sensing time is improved by 55% and 10%, respectively, and the power consumption is reduced by 12% and 44%, respectively. Furthermore, the area of the SPSA is estimated to be 43% smaller than that of the ACSA. Although the SPSA has a 59% larger area than a dynamic pMOS sense amplifier, the area overhead can be mitigated by allocating a larger number of cells per bit-line (CpBL) because the performance of the SPSA is still better than that of the dynamic pMOS, even with a CpBL that is two times larger.</P>
Power-Gated 9T SRAM Cell for Low-Energy Operation
Oh, Tae Woo,Jeong, Hanwool,Kang, Kyoman,Park, Juhyun,Yang, Younghwi,Jung, Seong-Ook Institute of Electrical and Electronics Engineers 2017 IEEE transactions on very large scale integration Vol.25 No.3
<P>This brief proposes a novel power-gated 9T (PG9T) static random access memory (SRAM) cell that uses a read-decoupled access buffer and power-gating transistors to execute reliable read and write operations. The proposed 9T SRAM cell uses bit interleaving to achieve soft error immunity and utilizes a column-based virtual V-SS signal to eliminate unnecessary bitline discharges in the unselected columns, thereby reducing the energy consumption. In a 22-nm FinFET technology, the proposed PG9T SRAM cell has a minimum operating voltage of 0.32 V while achieving the 6 sigma read stability yield. Compared with the previously proposed 9T SRAM cell, the proposed cell consumes 45% and 17% less energy per read and write operation, respectively, at the minimum operating voltage, and has a 12% smaller bit cell area.</P>