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朴長植,張大正 홍익대학교 산업기술연구소 2000 産業技術 Vol.10 No.-
The etching characteristics of Cu-10%Sn alloys have been examined using EBSD (Electron Backscatter Diffraction) apparatus equipped in the SEM (Scanning Electron Microscope). The grains with their plane normal on the etched surface parallel to [001] are shown to have the best resistance to corrosion by the etchant and appear light in the optical microscope. The grains with their plane normal parallel to [111] have the least resistance to corrosion and appear dark in the optical microscope. The grains with their normal parallel to[101]have medium resistance to corrosion and appear gray in the optical microscope. The contrast for each grain is opposite in the SEM pictures. These etching characteristics result from the unusually high corrosion resistance of (001) plane. The other planes suffer accelerated corrosion until the surface is covered with polyhedrons with their surfaces enclosed with (001) planes. These polyhedrons are responsible for the surface roughness found on the grains other than (001) ones, causing the difference in the contrast.