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< 구두-B-06 > X-Ray Diffraction Measurement of Cellulose in Wood Cell Wall using Synchrotron Radiation
( Changgoo Lee ),( Takanori Sugimoto ),( Erina Kojima ),( Yasutoshi Sasaki ),( Mariko Yamasaki ) 한국목재공학회 2018 한국목재공학회 학술발표논문집 Vol.2018 No.1
In this study, crystalline cellulose in each layer of the wood cell (trachied) wall were measured using both in-plane and out-of-plane measurements of synchrotron radiation X-ray diffraction (SXRD). Using two approaches (in-plane and out-of-plane diffraction) it attempted to measure the cellulose polymers in each layer of the tracheid wall, which occupies the majority of the space in wood cells. Specimens were two types of new wood, cured in the last few years, and aged wood, from a structure over 250 years old. Measurements were performed in the cellulose (004) reflection plane. Two-dimensional (2D) diffraction patterns obtained for in-plane and out-of-plane measurements were used to derive diffraction intensity profiles at azimuthal angle b and 2q for analysis. It had shown the two SXRD techniques resulted in greatly different 2D diffraction patterns, indicating differences in the distribution characteristics of cellulose. b profiles showed cellulose chains measured by in-plane and out-of-plane SXRD as respectively oriented at about 9° and 75° with respect to the longitudinal axis (grain) of the specimens. Moreover, calculations based on the 2q profiles estimated that the in-plane method captured approximately 7 times as much crystalline cellulose as the out-of-plane method. These findings suggest that in-plane SXRD measurements are primarily of cellulose in the S2 layer of the secondary wall, while out-of-plane measurements mainly capture S1 and S3 cellulose.