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김성현,김수은 한국물리학회 2018 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.73 No.3
For comparative friction studies, a reference sample, which holds stable and reproducible frictional characteristics, is required. Here, we have studied the frictional properties of native silicon oxide and silicon oxide formed through wet thermal oxidation by using lateral force microscopy. Once cleansed using solvents such as acetone, the friction measured on these frequently-used reference materials undergoes gradual change by a series of scanning. The friction is observed to increase with the number of scans and reaches about 1.5 times the initial value. We find that soft baking at 150 °C - 200 °C for 30 minutes can eliminate this problem.
Gain and Scan Rate Dependence of Friction at the Nanoscale Measured by Lateral Force Microscopy
김성현,김수은 한국물리학회 2018 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.73 No.3
Lateral force microscopy (LFM) is used to examine friction at the nanoscale. Although the friction at the tip-sample contact measured by LFM can provide extensive information beyond the friction force itself, such as the crystallographic orientation, the presence of defects, etc., there have been many contradictory reports regarding friction coecients, nanoscale friction laws, etc. obtained by this technique. Here we investigate the effect of scan rate and gain on the LFM frictional force measurements. We show that the ratio of friction measured on SiO2 to friction measured on graphene can vary from about 1 to approximately 9.2 depending on the combination of these parameters. We discuss how to optimize the associated scan parameters to obtain reliable friction data at the nanoscale.