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Effects of the Morphology of CIPs on Microwave Absorption Behaviors
우수빈,유찬세,김휘준,이미정,Manuel Quevedo-Lopez,최현주 대한금속·재료학회 2017 ELECTRONIC MATERIALS LETTERS Vol.13 No.6
Electromagnetic (EM) wave absorption properties are affected by thethickness and surface area of absorbing materials. In this study, afacile ball-milling process was introduced to effectively reduce thediameter and increase the aspect ratio of carbonyl iron powder (CIP),which is one of the most commercially available EM-absorbingmaterials. The size, aspect ratio, and consequent surface area of CIPwere manipulated by controlling the milling parameters to investigatetheir effects on EM absorption properties. The results indicated thatball-milled CIPs exhibited better EM wave absorption ability whencompared with that of pristine CIPs. However, significant differencesin minimum reflection loss values were not observed between CIPswith different morphologies and similar specific surface areas. Hence,both fine and flaky CIPs were considered as beneficial for EM waveabsorption.
Development of CIP/Graphite Composite Additives for Electromagnetic Wave Absorption Applications
우수빈,유찬세,김휘준,이미정,Manuel Quevedo-Lopez,최현주 대한금속·재료학회 2017 ELECTRONIC MATERIALS LETTERS Vol.13 No.5
In this study, the electromagnetic (EM) wave absorption abilityof carbonyl iron powder (CIP)/graphite composites produced byball milling were studied in a range of 28.5 GHz to examine theeffects of the morphology and volume fraction of graphite onEM wave absorption ability. The results indicated that a ballmilling technique was effective in exfoliating the graphite andcovering it with CIP, thereby markedly increasing the specificsurface area of the hybrid powder. The increase in the surface area and hybridization with dielectric loss materials (i.e., graphite)improved EM absorbing properties of CIP in the range of S and X bands. Specifically, the CIP/graphite composite containing3 wt% graphite exhibited electromagnetic wave absorption of −13 dB at 7 GHz, −21 dB at 5.8 GHz, and −29 dB at 4.3 GHz after1 h, 8 h, and 16 h of milling, respectively.
Carlos Avila-Avendano,Adelmo Ortiz-Conde,Jesus A. Caraveo-Frescas,Manuel A. Quevedo-Lopez 한국전기전자재료학회 2021 Transactions on Electrical and Electronic Material Vol.22 No.4
A novel method for the parameter extraction of thin-fi lm transistors in weak-conduction and triode-region is presented. The parameter extraction is performed using two different and consistent functions based on the integration of experimental output characteristic. The method was tested using measured data of polycrystalline silicon (poly-Si) thin-film transistors (TFTs) and the results were compared with previously reported conventional methods.