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Efficacy of Endoscopic Submucosal Dissection of Esophageal Neoplasms under General Anesthesia
Koichi Hamada,Koichiro Kawano,Atsushi Yamauchi,Ryota Koyanagi,Yoshinori Horikawa,Shinya Nishida,Yoshiki Shiwa,Noriyuki Nishino,Michitaka Honda 대한소화기내시경학회 2019 Clinical Endoscopy Vol.52 No.3
Background/Aims: Evidence that general anesthesia (GA) reduces the operative time of esophageal endoscopic submucosal dissection(ESD) is currently insuffcient. This study aims to evaluate the effcacy and safety of esophageal ESD under GA. Methods: A total of 227 lesions from 198 consecutive patients with superficial esophageal neoplasms treated by ESD at 3 Japaneseinstitutions between April 2011 and September 2017 were included in this retrospective study. For ESD, GA and deep sedation (DS)were used in 102 (51.5%, GA group) and 96 patients (48.5%, DS group), respectively. Results: There were no statistically significant differences in age, sex, or comorbidities between the groups. In the GA group, the tumorsize was larger (21 [3–77] mm vs. 14 [3–63] mm, p<0.001), luminal circumference was larger (≥2/3; 13.9% vs. 5.4%, p=0.042), proceduretime was shorter (28 [5–202] min vs. 40 [8–249] min, p<0.001), and submucosal dissection speed was faster (25.2 [7.8–157.2] mm2 /minvs. 16.2 [2.4–41.3] mm2 /min, p<0.001). The rates of intraoperative perforation and aspiration pneumonia were lower in the GA group,but the difference did not achieve statistical significance (p=0.242 and p=0.242). Conclusions: GA shortens the procedure time of esophageal ESD.
Hisashi Oshima,Masafumi Kobune,Hideto Tada,Koji Fukushima,Hideshi Yamaguchi,Koichiro Honda 한국물리학회 2009 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.55 No.2
The formation mechanism of the perovskite structure, the structural properties, and the ferroelectric properties of bismuth lanthanoid nickel titanate (Bi1−xLnx)(Ni0.5Ti0.5)O3 (BLNT, Ln:La, Nd, or Sm, x = 0 − 0.9) thin films deposited on Pt(100)/MgO(100) substrates by sputtering have been investigated using X-ray diffraction and transmission electron microscopy. The present (Bi1−xLax)(Ni0.5Ti0.5)O3 (BLNT, x ≥0.3), (Bi1−xNdx)(Ni0.5Ti0.5)O3 (BNNT, x 0.4), and (Bi1−xSmx)(Ni0.5Ti0.5)O3 (BSNT, x≥0.6) films were confirmed to have been grown heteroepitaxially and to have had a single-phase perovskite structure. It is shown that of the three, the La-substituted BLNT (x = 0.5) film exhibits the best hysteresis loop shape with a remanent polarization of 12 μC/cm2. The formation mechanism of the perovskite structure, the structural properties, and the ferroelectric properties of bismuth lanthanoid nickel titanate (Bi1−xLnx)(Ni0.5Ti0.5)O3 (BLNT, Ln:La, Nd, or Sm, x = 0 − 0.9) thin films deposited on Pt(100)/MgO(100) substrates by sputtering have been investigated using X-ray diffraction and transmission electron microscopy. The present (Bi1−xLax)(Ni0.5Ti0.5)O3 (BLNT, x ≥0.3), (Bi1−xNdx)(Ni0.5Ti0.5)O3 (BNNT, x 0.4), and (Bi1−xSmx)(Ni0.5Ti0.5)O3 (BSNT, x≥0.6) films were confirmed to have been grown heteroepitaxially and to have had a single-phase perovskite structure. It is shown that of the three, the La-substituted BLNT (x = 0.5) film exhibits the best hysteresis loop shape with a remanent polarization of 12 μC/cm2.
Hideto Tada,Masafumi Kobune,Koji Fukushima,Hisashi Oshima,Daisuke Horit,Akihiro Tamura,Yusuke Daiko,Atsushi Mineshige,Tetsuo Yazawa,Hironori Fujisawa,Masaru Shimizu,Hideshi Yamaguchi,Koichiro Honda 한국물리학회 2009 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.55 No.2
The structural characteristics, the mechanism of crystal growth, and the ferroelectric properties of partially Sm-substituted perovskite bismuth-samarium-nickel-titanate [(Bi1−xSmx)(Ni0.5Ti0.5)- O3; BSNT, x = 0− 0.9] thin films deposited on Pt(100)/MgO(100) substrates by rf sputtering have been investigated using X-ray diffraction, transmission electron microscope, and polarization - electric field hysteresis loop measurements. The fabricated BSNT samples with x≥0.6 were confirmed to have a single-phase perovskite structure. Of the four samples (x = 0.6 0.7, 0.8, and 0.9) with a single-phase perovskite structure, the c-axis-oriented epitaxial BSNT film with x = 0.9 exhibited the best hysteresis loop, with a remanent polarization of 2 μC/cm2 and a coercive field of 100 kV/cm. The structural characteristics, the mechanism of crystal growth, and the ferroelectric properties of partially Sm-substituted perovskite bismuth-samarium-nickel-titanate [(Bi1−xSmx)(Ni0.5Ti0.5)- O3; BSNT, x = 0− 0.9] thin films deposited on Pt(100)/MgO(100) substrates by rf sputtering have been investigated using X-ray diffraction, transmission electron microscope, and polarization - electric field hysteresis loop measurements. The fabricated BSNT samples with x≥0.6 were confirmed to have a single-phase perovskite structure. Of the four samples (x = 0.6 0.7, 0.8, and 0.9) with a single-phase perovskite structure, the c-axis-oriented epitaxial BSNT film with x = 0.9 exhibited the best hysteresis loop, with a remanent polarization of 2 μC/cm2 and a coercive field of 100 kV/cm.
Akihiro Tamura,Masafumi Kobune,Kazuki Imagawa,Hisashi Oshima,Yusuke Daiko,Atsushi Mineshige,Tetsuo Yazawa,Hiroshi Nishioka,Hironori Fujisawa,Masaru Shimizu,Hideshi Yamaguchi,Koichiro Honda 한국물리학회 2011 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.59 No.31
3.0-mm-thick a- and b-axis-oriented (Bi_(3.25)Nd_(0.75))Ti_3O_(12) (BNT-0.75) films were fabricated on conductive Nb:TiO_2(101) (Nb = 0, 0.048, 0.46, 0.79 mass%) single crystal substrates by high-temperature sputtering. A BNT films grown on undoped TiO_2 substrates have no orientation, whereas BNT films deposited on Nb:TiO_2 substrates with 0.46-0.79 mass% Nb show strong (h00/0k0) diffractions and grow with a heteroepitaxial relationship to the underlying Nb:TiO_2 substrates. The BNT-0.75 film deposited on Nb:TiO_2(101) substrate with 0.79 mass% Nb was indicated the peculiar shape of approximately 100-150-nm-thick nanoplates. We speculate that the driving force for producing a plate-like structure for BNT films is attributed to the large anisotropy of linear expansion coefficients for Bi_4Ti_3O12, and the comparatively small lattice matching between Nb:TiO_2 substrate and BNT film.
Masafumi Kobune,Hisashi Oshima,Akihiro Tamura,Kazuki Imagawa,Yusuke Daiko,Atsushi Mineshige,Tetsuo Yazawa,Hitoshi Morioka,Keisuke Saito,Hideshi Yamaguchi,Koichiro Honda 한국물리학회 2011 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.59 No.31
a- and b-axis-oriented (Bi_(3.25)Nd_(0.75))Ti_3O_(12) films, 3.0 mm thick, were fabricated on conductive IrO_2(101)/Al_2O_3(012) and Nb:TiO_2(101) [Nb = 0, 0.05 and 0.79 mass%] substrates by high-temperature sputtering. A BNT film grown on an IrO_2(101)/Al_2O_3(012) substrate had a low crystallinity (2.83˚), a low degree of a- and b-axis orientations [a_((h00/0k0)) = 49.2%] and a dense microstructure that a- and b-axis-oriented crystals existed locally in the film, while a BNT film grown on Nb:TiO_2(101) substrate with 0.79 mass% Nb showed a high crystallinity (0.57˚), a high a_((h00/0k0)) (99.9%) and a porous microstructure that was comprised of many nanoplate-like crystals. It is shown that the BNT film grew with a heteroepitaxial relationship to the underlying Nb:TiO_2 substrate has a symmetric loop shape, with a remanent polarization (2P_r) of 29 mC/cm^2 and a coercive field (2E_c) of 297 kV/cm.