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Energy per Particle in BEC for 87Rb and 7Li
Dooyoung Kim,Jin-Hee Yoon,Guanghao Jin 한국물리학회 2005 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.46 No.2
We test the validity of the equivalent linear two-body(ELTB) equation by calculating the energies per particle and the wave functions for 87Rb gas and for 7Li gas. For this, we use the quantum-mechanical variational method for the Bose-Einstein condensate energy. Our result for 87Rb gas agrees with a numerical calculation based on the Gross-Pitaevskii equation, with a relative error of 12 % over a wide range of N from 100 to 10000, and the result for a 7Li gas shows a behavior consistent with that observed in experiments. Therefore, we can conclude that the ELTB equation describes quite well the behavior of an N-boson system in its BEC state.
Cost-efficient Chip Identification Method using Scan Flip-flop based Physically Unclonable Function
Dooyoung Kim,M. Adil Ansari,Jihun Jung,Jinuk Kim,Sungju Park 대한전자공학회 2018 Journal of semiconductor technology and science Vol.18 No.2
Scan flip-flop based physically unclonable function (SCAN-PUF) has been proposed to protect integrated circuits (ICs) from security threats such as unauthorized access and IC cloning. In this paper, we propose an efficient SCAN-PUF technique that improves the uniqueness of responses with low cost overhead. The proposed SCAN-PUF first determines an optimal number of power-up state observations and then selects scan flip-flops as the PUF elements (P-ELEMENTs) through a given number of observations. A Bayesian model is adopted to evaluate the reliability of the P-ELEMENTs, and a grouped PELEMENT selection method is introduced to obtain more P-ELEMENTs than a predetermined threshold. To evaluate the proposed SCAN-PUF, we observed the power-up states of scan flip-flops from 15 chips fabricated using the 65-nm CMOS technology. The optimal number of observations is determined according to the reliability of the P-ELEMENTs, and the reliability, randomness, and uniqueness of the responses are then analyzed.
Dooyoung Kim,Ui Wook Hwang 한국응용곤충학회 2024 한국응용곤충학회 학술대회논문집 Vol.2024 No.04
Nialoe Tanaka, 1958 is a subgenus of the ground beetle genus Pterostichus (Coleoptera: Carabidae), endemic to East Asia. In a wide sense of Nialoe, it consists of more than 200 species, which has reduced hindwing and possibly diversified by geographical isolation due to poor dispersal ability. To understand this vast group, phylogenetic studies have been conducted, showing that Nialoe s. lat. comprises of five subgenera: Nialoe s. str., Sphodroferonia, Koreonialoe, and two unnamed subgenera. However, there is little knowledge regarding their origin and dispersal. In this study, we examine phylogenetic relationships among the five subgenera of Nialoe s. lat. based on 28S rRNA, wingless, COI, and 16S rRNA. The molecular clock and S-DIVA analyses are devised to investigate the biogeographical history of the group in East Asia. This study may give insight into the biogeographical dispersal and diversification of East Asian carabids.
Dooyoung Kim,윤진희,Dongwoo Cha 한국물리학회 2010 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.56 No.1
Recently, it was shown that a simple empirical formula, in terms of the mass and the valence nucleon numbers, could describe the main trends of the yrast excitation energies of the natural parity states up to 10+ in even-even nuclei throughout the entire periodic table. The same empirical formula was applied to the yrast excitation energies of the unnatural parity states, including 1+,2−, 3+, 4−, 5+, 6−, 7+, 8−, 9+, 10−, and 11+, in even-even nuclei. Although the overall character of the effective residual interaction for the unnatural parity states was quite different from that of the natural parity states, the same form of the empirical formula was found to hold reasonably well for the yrast excitation energies of the unnatural parity states.
Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain Reordering
Dooyoung Kim,Jinuk Kim,Muhammad Ibtesam,Umair Saeed Solangi,Sungju Park 대한전자공학회 2020 Journal of semiconductor technology and science Vol.20 No.4
With advancements in process technology and ever-increasing complexity of digital circuits, testing has become a prominent problem. The lengthy scan chains used for testing semiconductor chips cause not only the longer test time but also excessive test power consumption. Such excessive test power (especially peak power during shifting) can cause reliability degradation for the semiconductor. To resolve this problem, we introduce an exclusive shift-in and shift-out method along with a scan chain reordering algorithm. The proposed method is evaluated with several benchmark circuits including ISCAS’89, ITC’99 and IWLS’05. The results indicate that the proposed technique reduces the average power and helps mitigating the peak power consumption. In addition, an optimization method is introduced to reduce the area overhead of proposed scan technique. As a result, area overhead of proposed scan architecture was reduced to 1-11%.
Deep Full-Body Motion Network for a Soft Wearable Motion Sensing Suit
Kim, Dooyoung,Kwon, Junghan,Han, Seunghyun,Park, Yong-Lae,Jo, Sungho IEEE 2019 IEEE/ASME transactions on mechatronics Vol.24 No.1
<P>Soft sensors are becoming more popular in wearables as a means of tracking human body motions due to their high stretchability and easy wearability. However, previous research not only was limited to only certain body parts, but also showed problems in both calibration and processing of the sensor signals, which are caused by the high nonlinearity and hysteresis of the soft materials and also by the misplacement and displacement of the sensors during motion. Although this problem can be alleviated through redundancy by employing an increased number of sensors, it will lay another burden of heavy processing and power consumption. Moreover, complete full-body motion tracking has not been achieved yet. Therefore, we propose use of deep learning for full-body motion sensing, which significantly increases efficiency in calibration of the soft sensor and estimation of the body motions. The sensing suit is made of stretchable fabric and contains 20 soft strain sensors distributed on both the upper and the lower extremities. Three athletic motions were tested with a human subject, and the proposed learning-based calibration and mapping method showed a higher accuracy than traditional methods that are mainly based on mathematical estimation, such as linear regression.</P>
Kim, Dooyoung,Ansari, M. Adil,Jung, Jihun,Park, Sungju The Institute of Electronics and Information Engin 2016 Journal of semiconductor technology and science Vol.16 No.5
Various test data compression techniques have been developed to reduce the test costs of system-on-a-chips. In this paper, a scan chain reordering algorithm for code-based test data compression techniques is proposed. Scan cells within an acceptable relocation distance are ranked to reduce the number of conflicts in all test patterns and rearranged by a positioning algorithm to minimize the routing overhead. The proposed method is demonstrated on ISCAS '89 benchmark circuits with their physical layout by using a 180 nm CMOS process library. Significant improvements are observed in compression ratio and test power consumption with minor routing overhead.
Dooyoung Kim,M. Adil Ansari,Jihun Jung,Sungju Park 대한전자공학회 2016 Journal of semiconductor technology and science Vol.16 No.5
Various test data compression techniques have been developed to reduce the test costs of system–on–a–chips. In this paper, a scan chain reordering algorithm for code–based test data compression techniques is proposed. Scan cells within an acceptable relocation distance are ranked to reduce the number of conflicts in all test patterns and rearranged by a positioning algorithm to minimize the routing overhead. The proposed method is demonstrated on ISCAS ’89 benchmark circuits with their physical layout by using a 180 nm CMOS process library. Significant improvements are observed in compression ratio and test power consumption with minor routing overhead.