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TEM investigation of hydrogen-implanted and annealed single-crystal SrTiO3
G.K.H. Pang,C.W. Tai,Y. Wang,W.L. Liu,Z.T. Song,S.L. Feng,H.L.W. Chan,C.L. Choy 한국물리학회 2006 Current Applied Physics Vol.6 No.3
In this study, the structural properties of single-crystal SrTiO3 implanted with H+ have been investigated by transmission electronmicrocopy (TEM). The investigation was carried out on an as-implanted sample and samples after annealing at 500.C and 700 .Cfrom the implanted energy similar to the process in the case of silicon. The as-implanted sample shows large out-of-plane strain alsosimilar to the report in silicon. The microcavities are lled with amorphous material as the result of complicated interaction of the defectsduring the annealing.