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Micro-Factory 공정간 마이크로 부품 검사 프로브 개발
김기홍(Geehong Kim),이득우(D.W. Lee) 한국생산제조학회 2005 한국생산제조시스템학회 학술발표대회 논문집 Vol.2005 No.5
This paper shows a non-contact optical method to inspect micron scale parts which will be manufactured in micro-factory system. This inspection system should have some characteristics like a small size, flexibility, and high measuring speed. In the viewpoint of measuring capabilities, it also has resolution under micron scale with measuring range over millimeter scale. Two methods will be presented in this paper, one is Moire and the other is white-light scanning interferometry. Also some experimental results will be presented to show the possibilities of the proposed inspection system.
Micro- Factory 공정간 마이크로 부품 검사 프로브 개발
김기홍(Geehong Kim),이득우(D.W. Lee) 한국생산제조학회 2005 한국공작기계학회 추계학술대회논문집 Vol.2005 No.-
This paper shows a non-contact optical method to inspect micron scale parts which will be manufactured in micro-factory system. This inspection system should have some characteristics like a small size, flexibility, and high measuring speed. In the viewpoint of measuring capabilities, it also has resolution under micron scale with measuring range over millimeter scale. Two methods will be presented in this paper, one is Moire and the other is white-light scanning interferometry. Also some experimental results will be presented to show the possibilities of the proposed inspection system.
김기홍(Geehong Kim),이득우(D.W. Lee) 한국생산제조학회 2006 한국공작기계학회 춘계학술대회논문집 Vol.2006 No.-
This paper deals with two kinds of subjects. The one is stitching algorithm for aspheric lenses to analyze a larege area measurement. In this part, it will shows the mechanism to manipulate the object, and stitching process, and stitching algorithm based on polar coordinate. The other is 3D rendering problems when handling a large data set. In general cases, the speed of handling 3D measuring data will be down dramatically if measuring data exceed 300,000 pixels, a basic pixel size of normal NTSC camera. In this paper, modified ROAM algorithm which is used for terrain rendering problem in computer graphics is adapted to enhance the speed of 3D rendering.
김기홍(Geehong Kim),이득우(D.W. Lee) 한국생산제조학회 2007 한국공작기계학회 춘계학술대회논문집 Vol.2007 No.-
This paper deals with the effects of light sources in white-light scanning interferometry. The spectrum of light sources determines the coherence lengths in white-light scanning interferometry, and it will be represented by a sharpness, and length of interferograms. For a long time, tungsten-halogen lamps have been used for light sources because of brightness and price. But the light efficiency of them is very low, because they generate more heat, usually IR region, than visible light. Above all, fibers are used to guide light, and there is significant loss of power when the length of fiber exceed 2~3m. Recently LEDs are widely used for general illuminations, and they are getting brighter. This paper compares the effects of these two light sources.
김기홍(Geehong Kim),임형준(Hyungjun Lim),이재종(Jaejong Lee),최기봉(KeeBong Choi),박현하(Hyunha Park),김하나(Hana Kim),도이미(Lee-Mi Do) 한국생산제조학회 2011 한국생산제조시스템학회 학술발표대회 논문집 Vol.2011 No.4
This paper shows the method of fabrication of a microlens array comprised of a Nipkow disk used in a large-area, high-speed confocal microscopy. A Nipkow disk has two components, a microlens array disk and a pinhole array disk. The microlens array focuses illumination light onto the pinhole array disk and redirects reflected light from a surface to a sensor. The microlens which are positioned in order on a disk have a hemispheric shape with a few tens of micron in diameter, and can be fabricated by a variety method like mechanical machining, semiconductor process, replication process like imprinting method. This paper shows how to fabricated a microlens array which has a long focal length by reflow and imprinting process.
김기홍(Geehong Kim),이득우(D.W. Lee) 한국생산제조학회 2006 한국공작기계학회 춘계학술대회논문집 Vol.2006 No.-
This paper shows large area measuring method using white-light scanning interferometry. In most cases using optical instruments, the measuring area will be restricted by field of view of objectives. So we need another method in order to measure large area over the field of view. Stitching method has been studied for a long time to overcome this restriction. This method makes one 3D map by merging many results which are measured separatedly but have some overlapped regions among consecutive areas. The most important advantage is that we can analyze large area 3D profile without sacrificing lateral resolution.
Micro- Factory 공정간 마이크로 부품 검사 프로브 개발
김기홍(Geehong Kim),이득우(D.W. Lee) 한국생산제조학회 2005 한국생산제조시스템학회 학술발표대회 논문집 Vol.2005 No.10
This paper shows a non-contact optical method to inspect micron scale parts which will be manufactured in micro-factory system. This inspection system should have some characteristics like a small size, flexibility, and high measuring speed. In the viewpoint of measuring capabilities, it also has resolution under micron scale with measuring range over millimeter scale. Two methods will be presented in this paper, one is Moire and the other is white-light scanning interferometry. Also some experimental results will be presented to show the possibilities of the proposed inspection system.