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김동한(D. H. Kim),장경영(K. Y. Jhang),장석원(S. W. Chang) 대한기계학회 2001 대한기계학회 춘추학술대회 Vol.2001 No.8
Backside defect of plate structure may grow due to fatigue or overload to cause critical failure during operation, so it is important to detect this kind of defect in line. For this purpose, nondestructive, non-contact and highly sensitive method is required, and ESPI and Shearography are considered as useful methods to satisfy these requirements. In this paper, the possibility of application of ESPI and Shearography to detect the backside defect of steel plate and to quantify the defect size was tested. For the experiment, some steel plates with a circular defect on the backside were prepared. Experimental results for these plates showed that location and size of defect could be detected correctly by both of ESPI and Shearography.