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이덕보(D. B. Lee),김정현(J. H. Kim),강수근(S. K. Kang),김상도(S. D. Kim),장석원(S. W. Chang),임재훈(J. H. Lim),유동수(D. S. Ryu) 대한기계학회 2005 대한기계학회 춘추학술대회 Vol.2005 No.5
In evaluation of electronic reliability on the PCB(Printed Circuit Board),electrochemical migration is one of main test objects. The phenomenon of electrochemical migration occurs in the environment of the high humidity and the high temperature under bias through a continuous aqueous electrolyte. In this paper, the generating mechanism of electrochemical migration is investigated by using water drop acceleration test under various waters. The waters used in the water drop test are city water, distilled water and ionic water. It found that the generated velocity of electrochemical migration depended on the temperature of water and the electrolyte quantity which included in the various waters.
형광램프 필라멘트 단선의 고장분석 및 내구설계기술에 관한 연구
이덕보(D. B. LEE),김정현(J. H. Kim),장석원(S. W. Chang),유동수(D. S. Ryu) 한국동력기계공학회 2004 한국동력기계공학회 학술대회 논문집 Vol.- No.-
The opening test of a filament is very important for the reliability of fluorescent lamps. Two types of accelerated stress tests are performed using fluorescent lamps(FL20SD/18) made in various companies. Failure mechanisms of filament in fluorescent lamps are investigated by the filament accelerated stress test and voltage accelerated stress test. Their characteristics are compared field data with accelerated stress test data. The failure sites of filament in fluorescent lamp were occurred at the middle part of filament due to radiant heat and the edge part of filament due to torsional stress caused by thermal stress. In the case of accelerated stress test, the filament accelerated stress test is better than the voltage accelerated stress test for the □reappearance of opening test in the filament.
이덕보(D. B. LEE),장석원(S. W. Chang),유동수(D. S. Ryu) 한국동력기계공학회 2004 한국동력기계공학회 학술대회 논문집 Vol.- No.-
Surface design of dental post materials improves adhesive force between a post and a root dentin and has significant influences on the reliability in endodontically treated tooth. To investigate relationship between the design of shape and the strength of material, dental posts made of nickel-chromium alloy were prepared. Three-point bending test was performed using the post material, which is utilized actually in teeth treatment. The fracture surface of specimen was examined by Scanning Electron Microscope(SEM) through failure analysis. Based on experimental results, the numerical analysis was simulated using ABAQUS, one of commercial software. The bending strength of modified post material model is higher than that of custom post material model. The modified design of the dental post material was also proposed.
김동한(D. H. Kim),장경영(K. Y. Jhang),장석원(S. W. Chang) 대한기계학회 2001 대한기계학회 춘추학술대회 Vol.2001 No.8
Backside defect of plate structure may grow due to fatigue or overload to cause critical failure during operation, so it is important to detect this kind of defect in line. For this purpose, nondestructive, non-contact and highly sensitive method is required, and ESPI and Shearography are considered as useful methods to satisfy these requirements. In this paper, the possibility of application of ESPI and Shearography to detect the backside defect of steel plate and to quantify the defect size was tested. For the experiment, some steel plates with a circular defect on the backside were prepared. Experimental results for these plates showed that location and size of defect could be detected correctly by both of ESPI and Shearography.
이덕보(D. B. Lee),김정현(J. H. Kim),강수근(S. K. Kang),조영진(Y. J. Cho),장석원(S. W. Chang),임재훈(J. H. Lim),유동수(D. S. Ryu) 대한기계학회 2005 대한기계학회 춘추학술대회 Vol.2005 No.5
The opening test of a filament is very important for the reliability of fluorescent lamps. Failure mechanisms of filament in fluorescent lamps are investigated by the filament accelerated stress test and voltage accelerated stress test. The characteristics of the accelerated test data are also compared with those of field data. The failure sites of filament in fluorescent lamp were occurred at the middle part of filament due to radiant heat and the edge part of filament due to torsional stress caused by thermal stress. It found that the life time of fluorescent lamp was effected by the cooling time and the structure of filament.
Water drop 가속시험에 의한 이온 마이그레이션 발생 메커니즘
이덕보(D. B. LEE),강수근(S. K. Kang),장석원(S. W. Chang),유동수(D. S. Ryu) 한국동력기계공학회 2004 한국동력기계공학회 학술대회 논문집 Vol.- No.-
In evaluation of electronic reliability on the PCB(Print Circuit Borad), electrochemical migration is one of main test objects. The phenomenon of electrochemical migration occurs in the environment of the hight humidity and the hight temperature under bias through a continuous aqueous electrolyte. In this paper, the generating mechanism of electrochemical migration is investigated by using water drop acceleration test under various waters. The waters used in the water drop test are city water, distilled water and ionic water. It found that the generated velocity of electrochemical migration depended on electrolyte quantity which included in the various waters.