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김강철 여수대학교 1999 論文集 Vol.14 No.2
In this paper, a novel test method using offset voltage is proposed to detect the hard and soft fault in analog circuits of mixed-mode IC. When the input of the op-amp is grounded, a good circuit has a small offset voltage, but a faulty circuit has a large offset voltage. Faults which cause the offset voltage to exceed a predefined voltage ranges in the op-amp can be detected. No test vector is required in the proposed method, therefore the test time coast can be reduced.
이효상,송근호,김강철,한석붕 慶尙大學校 工科大學 自動化및컴퓨터應用技術硏究所 1995 自動化 및 컴퓨터應用技術 Vol.2 No.1
This paper proposes a testing method which can detect the bridging faults of CLA adder designed by ENMODL in transistor level. It is a application of IDDQ testing method. In conventional dynamic CMOS, no current flows through CMOS clocking device in spite of the fault in the function block. But in ENMODL CMOS, the current flows through the second level, which is the enhanced structure by the application of the proper test pattern. The possibility of testing is verified by SPICE 3 simulation.
내부 전류 테스팅을 위한 내장형 전류감지기의 설계 및 구현
송근호,방만식,이효상,서정훈,김강철,한석붕 慶尙大學校 工科大學 自動化및컴퓨터應用技術硏究所 1997 自動化 및 컴퓨터應用技術 Vol.4 No.1
This paper proposes a new BIC(Built-in Current sensor) for the internal current test in CMOS logic circuits. Our BIC is composed of current sensor, level shifter, comparator, and reference voltage circuit. The current sensor parallel connected with one diode and one nMOS device can convert the current of CUT(Circuit Under Test) to voltage. A single phase clock is employed in the BIC reduce the control circuitry of it and to perform a self-testing for a faulty current. The proposed BIC is verified by using the HSPICE simulator and fabricated in 0.8 ㎛ twin-tub process. The CUT is 4 bit full adder with bridging faults. The realized BIC successfully detects all bridging faults in CUT.