http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
Ion Induced Secondary Electron Emission of MgO with Patterned Gold Line Charge Neutralization
Jong-Wan Lee,Kie-Young Lee,Hong-Gyu Kim,Joon-Hyung Ahn,Won-Joon Jung,Sean J. Yoon,Byungdu Oh 한국진공학회(ASCT) 2001 Journal of Korean Vacuum Science & Technology Vol.5 No.1
Ion induced secondary electron emission coefficients γ of protecting layers of an AC plasma display panel(AC-PDP) have been measured. In order to solve the surface charging effect during the measurement at insulating samples like MgO, a new method with the patterned gold line charge neutralization has been introduced. The measurement was performed at the samples, MgO and MgO+MgF₂, which showed a great difference in the firing voltage between the two protecting layers. The γ value has been compared with the firing voltage V_f of the AC-PDP with the same protecting layer. Correct relationship between γ and V_f has been observed. Thus, the patterned gold line method has been proven to be successful for the measurement of the secondary electron emission yield at insulator sample surfaces.