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On multi-authority ciphertext-policy attribute-based encryption
Sascha Müller,Stefan Katzenbeisser,Claudia Eckert 대한수학회 2009 대한수학회보 Vol.46 No.4
In classical encryption schemes, data is encrypted under a single key that is associated with a user or group. In Ciphertext-Policy Attribute-Based Encryption(CP-ABE) keys are associated with attributes of users, given to them by a central trusted authority, and data is encrypted under a logical formula over these attributes. We extend this idea to the case where an arbitrary number of independent parties can be present to maintain attributes and their corresponding secret keys. We present a scheme for multi-authority CP-ABE, propose the first two constructions that fully implement the scheme, and prove their security against chosen plaintext attacks. In classical encryption schemes, data is encrypted under a single key that is associated with a user or group. In Ciphertext-Policy Attribute-Based Encryption(CP-ABE) keys are associated with attributes of users, given to them by a central trusted authority, and data is encrypted under a logical formula over these attributes. We extend this idea to the case where an arbitrary number of independent parties can be present to maintain attributes and their corresponding secret keys. We present a scheme for multi-authority CP-ABE, propose the first two constructions that fully implement the scheme, and prove their security against chosen plaintext attacks.
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Ben Tordoff,Cheryl Hartfield,Andrew J. Holwell,Stephan Hiller,Marcus Kaestner,Stephen Kelly,Jaehan Lee,Sascha Müller,Fabian Perez-Willard,Tobias Volkenandt,Robin White,Thomas Rodgers 한국현미경학회 2020 Applied microscopy Vol.50 No.1
The development of the femtosecond laser (fs laser) with its ability to provide extremely rapid athermal ablation of materials has initiated a renaissance in materials science. Sample milling rates for the fs laser are orders of magnitude greater than that of traditional focused ion beam (FIB) sources currently used. In combination with minimal surface post-processing requirements, this technology is proving to be a game changer for materials research. The development of a femtosecond laser attached to a focused ion beam scanning electron microscope (LaserFIB) enables numerous new capabilities, including access to deeply buried structures as well as the production of extremely large trenches, cross sections, pillars and TEM H-bars, all while preserving microstructure and avoiding or reducing FIB polishing. Several high impact applications are now possible due to this technology in the fields of crystallography, electronics, mechanical engineering, battery research and materials sample preparation. This review article summarizes the current opportunities for this new technology focusing on the materials science megatrends of engineering materials, energy materials and electronics.
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