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Dielectric Meta-Holograms Enabled with Dual Magnetic Resonances in Visible Light
Li, Zile,Kim, Inki,Zhang, Lei,Mehmood, Muhammad Q.,Anwar, Muhammad S.,Saleem, Murtaza,Lee, Dasol,Nam, Ki Tae,Zhang, Shuang,Luk’yanchuk, Boris,Wang, Yu,Zheng, Guoxing,Rho, Junsuk,Qiu, Cheng-Wei American Chemical Society 2017 ACS NANO Vol.11 No.9
<P>Efficient transmission-type meta-holograms have been demonstrated using high-index dielectric nanostructures based on Huygens principle. It is crucial that the geometry size of building blocks be judiciously optimized individually for spectral overlap of electric and magnetic dipoles. In contrast, reflection-type meta-holograms using the metal/insulator/metal scheme and geometric phase can be readily achieved with high efficiency and small thickness. Here, we demonstrate a general platform for design of dual magnetic resonance based meta-holograms based on the geometric phase using silicon nanostructures that are quarter wavelength thick for visible light. Significantly, the projected holographic image can be unambiguously observed without a receiving screen even under the illumination of natural light. Within the well-developed semiconductor industry, our ultrathin magnetic resonance-based meta-holograms may have promising applications in anticounterfeiting and information security.</P>
Deep Foundation Testing using Immunity-based Displacement Measurement in Successive-Sparse Images
Ali Raza,Umair Aqil,Ummul Baneen,Muhammad Q. Saleem 대한토목학회 2019 KSCE Journal of Civil Engineering Vol.23 No.10
This paper presents a new immunity-based approach to measure the displacement of nodes (or points of interest) in successive-yet-sparse images, in order to measure the settlement of deep-foundations under heavy loads. It is developed as a close-range photogrammetric technique to search the nodes, similar to immune-cells searching bacteria in their vicinity. The immunological concepts of chemotaxis, biased random walk, diffusion and inflammation are implemented herein to accomplish the task. The technique greatly reduces the errors and is also validated on site of a mega project to record the settlements in deep foundations. The accuracy levels are found to be conforming to ASTM's standards for static load testing, including both compression and lateral-load tests. Unlike other techniques, such as particle image velocimetry, this approach is able to handle successive-images with varying ΔTbetween them. Furthermore, the technique is completely autonomous and does not require any embedded instrumentation.