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Fixed target single-shot imaging of nanostructures using thin solid membranes at SACLA
Nam, Daewoong,Kim, Chan,Kim, Yoonhee,Ebisu, Tomio,Gallagher-Jones, Marcus,Park, Jaehyun,Kim, Sunam,Kim, Sangsoo,Tono, Kensuke,Noh, Do Young,Yabashi, Makina,Ishikawa, Tetsuya,Song, Changyong IOP 2016 Journal of Physics B: Atomic, Molecular and Optica Vol.49 No.3
<P>Single-shot imaging using femtosecond x-ray pulses from x-ray free electron lasers (XFELs) has revealed high-resolution structures of Au nanoparticles and biological macromolecular complexes. The x-ray pulse power of 10 GW is enough to vaporize specimen when it is focused on a few microns area. This makes it essential to have a single particle loader to provide fresh samples to the x-ray pulses. In this paper we introduce single-shot imaging at Spring-8 Angstrom Compact Free Electron Laser (SACLA) to investigate various types of specimen, from metallic nanoparticles to biological macromolecules, prepared on Si<SUB>3</SUB>N<SUB>4</SUB> membrane. A significant reduction in sample consumption is achieved while maintaining a data acquisition rate of 30 Hz, which is compatible with the current SACLA operation rate.</P>
Coherent Diffraction Imaging Using Focused Hard X-rays
Sunam Kim,Sangsoo Kim,Su Yong Lee,Chan Kim,Yoonhee Kim,Do Young Noh,Shashidhara Marathe,Changyong Song,Marcus Gallagher-Jones,Hyon Chol Kang 한국물리학회 2016 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.68 No.9
A quantitative height profile image of a silicon nano-trench structure was obtained via coherent diffraction imaging (CDI) utilizing focused X-rays at a photon energy of 5.5 keV. The ability to optimize the spatial coherence and the photon flux density of a focused X-ray beam was the key technique for achieving such technical progress at a given X-ray photon flux. This was achieved by investigating the tunability of the focused beam’s optical properties and performing a CDI experiment with the focused X-rays. The relationship between the focused X-rays’ optical properties (e.g., photon flux density and spatial coherence length) and the incident beam’s size, which can be tuned by adjusting the slits in front of the Fresnel zone plate (FZP) was elucidated. We also obtained a quantitative image of a nano-trench sample produced via the reconstruction process of CDI, which utilizes carefully tuned, focused X-rays.