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김헌중(Heon-Joong Kim),전문창(Moon-Chang Jeon),김동학(Dong-Hak Kim),강기주(Ki-Ju Kang) 대한기계학회 2002 대한기계학회 춘추학술대회 Vol.2002 No.3
A new way to measure the second parameter A₂ of CT specimens is described. The displacement δ? which is monitored continuously by real images of the lateral surface during crack growth is used to calculate the A₂ as a function of crack growth. The crack length is measured by DCPD(Direct Current Potential Drop) method and the J-resistance curve is determined according to ASTM standard El737-96. To prove the validity of this method, three dimensional finite element analyses were performed, and variation of the displacements δ? and A₂ along the thickness were explored. It has been shown that the δ? measured from the real images of the lateral surface and the corresponding A₂ can be regarded as the average through the thickness for IT and 1/2T specimens of SAl06Gr.C steel.
강기주(Ki-Ju Kang),임상채(Sang Chai Lim),이상신(Sang Shin Lee),전문창(Moon Chang Jeon),주재황(Jae Hwang Joo) 대한기계학회 2002 대한기계학회 춘추학술대회 Vol.2002 No.5
Recently, the authors have developed a new material test system for thin film at the high temperature. It is so compact and precise with sub micron resolution that it seems to be a useful tool for research of the oxide film growth, its mechanical behavior and failure mechanism. To this end, in this paper three methologies are described for in-situ monitoring of the displacement & strain and the temperature, the oxide thickness. These are the Laser Speckle analysis with digital image correlation technique, the two-color infra-red thermometer und the laser reflection interferometry respectively. The calibration results and some issues which should be addressed for practical application are presented.