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강현민 ( Hyunmin Kang ),박용문 ( Yongmun Park ),서용덕 ( Yongduek Seo ) 한국정보처리학회 2022 한국정보처리학회 학술대회논문집 Vol.29 No.2
In this paper, we propose a method of obtaining high density geometric information using multi-view structured light. Reconstruction error due to the difference in resolution between the projector and the camera occurs when reconstruction a 3D shape from a structured light system to a single projector. This shows that the error in the point cloud in 3D is also the same when reconstruction the shape of the object. So we propose a high density method using multiple projectors to solve such a reconstruction error.
김희진(Heejin Kim),김대일(Daeil Kim),최규호(Gyuho Choe),박용문(Yongmun Park),구현우(Hyounwoo Koo),김명준(Myoungjun Kim) 대한전자공학회 2019 대한전자공학회 학술대회 Vol.2019 No.6
Recent research on the requirement of 3D point clouds with very high density and accuracy is necessitates development of hardware system to capture a set of 3D point clouds of such a quality. Main issues include the accuracy of the captured points and the performance of computation. We propose a system that captures a set of 3D points with high accuracy and high speed. This is possible based on the calibration of the projector-camera system and the turn-table on which any object is placed and turned around. We show that there exists a geometric transformation between the camera and the turn-table, and as soon as we obtain the transformation from our calibration process, the registration of the point sets captured at multiple times may be done very quickly, through a one dimensional search.
김희진(Heejin Kim),김대일(Daeil Kim),최규호(Gyuho Choe),박용문(Yongmun Park),구현우(Hyounwoo Koo),김명준(Myoungjun Kim) 대한전자공학회 2020 대한전자공학회 학술대회 Vol.2020 No.8
In this paper, an automatic optical inspection of a display based on row line reference is proposed. Divide the line containing each display pixel by row line. An open defect was assigned by calculating a distance between display pixels included in one line. After considering the location of open defects, defects of short, bright, and dark points were assigned, and then adjacent defects were clustered. Through the proposed method, the OLED panel with 5 defects was inspected 100 times to confirm its accuracy.