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500MVA 단락발전기 여자시스템 특성 개선에 관한 고찰
정흥수(Heung-Soo Jung),나대열(Dae-Ryeol La),김선구(Sun-Koo Kim),노창일(Chang-il Roh),김원만(Won-Man Kim),이동준(Dong-Jun Lee),김선호(Sun-Ho Kim) 대한전기학회 2006 대한전기학회 학술대회 논문집 Vol.2006 No.7
The excitation system of 500MVA short-circuit generator is very important because of operation of various condition, for example, (over) load switching, short-time current, short-circuit current, etc. This paper introduces a feature of excitation system of 500MVA short-circuit facilities and the function and construction of each part.
ANSI/IEEE와 IEC 표준에 따른 변압기의 단락강도시험방법 비교고찰
김선호(Sun-Ho Kim),김선구(Sun-Koo Kim),김원만(Won-Man Kim),나대열(Dae-Ryeol La),박영기(Young-Ki Park),이동준(Dong-Jun Lee),정흥수(Heung-Soo Jung) 대한전기학회 2009 대한전기학회 학술대회 논문집 Vol.2009 No.10
Generally Short Circuit Test of transformers are peformed according to IEEE std C57.12.00:2006, IEC 60076-5:2006, KS C 4309:2003 and ES by KEPCO etc. Among these various standards IEC and IEEE standards are the basis of other standards as ES refers to IEEE std C57. 12.00 and KS C4309 is modification of IEC 60076-5. Therefore this study tries to compare these two main standards on the short circuit test conditions of the transformers before short circuit test, calculation method for test current peak value, tolerance on the asymmetrical peak and r.m.s value, short circuit testing procedure, number of short circuit test, duration short circuit test, and detection of faults and evaluation of short circuit test result.
ANSI/IEEE IEC 規格에 따른 變壓器의 短絡强度試驗의 比較
김선구(Sun-Koo Kim),김선호(Sun-Ho Kim),김원만(Won-Man Kim),나대열(Kim Dae-Ryeol),노창일(Chang-Il Roh),이동준(Dong-Jun Lee),정흥수(Heung-Soo Jung) 대한전기학회 2006 대한전기학회 학술대회 논문집 Vol.2006 No.7
Generally Short Circuit Test of transformers are tested according to IEEE std C57.12.00-2000, IEC 60076-5(2000-07), ES148(1998.6.26) or KS C4309(2003). But ES148 (1998.6.26) is same as IEEE std C57. 12.00-2000 and KS C4309(2003) is revising coincidence with IEC 60076-5 (2000 ~07). On this study condition of the transformers before short circuit test, calculation method for test current peak value, tolerance on the asymmetrical peak and r.m.s value, short circuit testing procedure, number of short circuit test, duration short circuit test, and detection of faults and evaluation of short circuit test result will be compared with ANSI and IEC.
노창일(Chang-il Roh),나대열(Dae-Ryeol La),김선구(Sun-Koo Kim),정흥수(Heung-Soo Jung),김원만(Won-Man Kim),이동준(Dong-Jun Lee),김선호(Lee Sun-Ho) 대한전기학회 2006 대한전기학회 학술대회 논문집 Vol.2006 No.7
The inrush current of transformer cause saturation effects of recovery voltage for short-circuit power testing. the inrush current depends on the residual flux of the transformer core. when inrush current occurs, it is contains a d.c. component and the high harmonic content of the current are of importance to relay protection of testing circuit. this paper describes of decrease method of inrush current for high power short-circuit testing transformer.