http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
Sampling Plans Based on Truncated Life Test for a Generalized Inverted Exponential Distribution
Singh, Sukhdev,Tripathi, Yogesh Mani,Jun, Chi-Hyuck Korean Institute of Industrial Engineers 2015 Industrial Engineeering & Management Systems Vol.14 No.2
In this paper, we propose a two-stage group acceptance sampling plan for generalized inverted exponential distribution under truncated life test. Median life is considered as a quality parameter. Design parameters are obtained to ensure that true median life is longer than a given specified life at certain level of consumer's risk and producer's risk. We also explore situations under which design parameters based on median lifetime can be used for other percentile points. Tables and specific examples are reported to explain the proposed plans. Finally a real data set is analyzed to implement the plans in practical situations and some suggestions are given.
Sampling Plans Based on Truncated Life Test for a Generalized Inverted Exponential Distribution
Sukhdev Singh,Yogesh Mani Tripathi,Chi-Hyuck Jun 대한산업공학회 2015 Industrial Engineeering & Management Systems Vol.14 No.2
In this paper, we propose a two-stage group acceptance sampling plan for generalized inverted exponential distribution under truncated life test. Median life is considered as a quality parameter. Design parameters are obtained to ensure that true median life is longer than a given specified life at certain level of consumer’s risk and producer’s risk. We also explore situations under which design parameters based on median lifetime can be used for other percentile points. Tables and specific examples are reported to explain the proposed plans. Finally a real data set is analyzed to implement the plans in practical situations and some suggestions are given.
Navjeet Singh,Anju Sood,Navyodh Singh,G.S. Buttar 대한산업공학회 2020 Industrial Engineeering & Management Systems Vol.19 No.3
Under truncated life tests, two types of attribute acceptance sampling plans are proposed, first is sequential sampling plan and other is repetitive acceptance sampling plan. These plans ensure the quality of products in terms of the mean lifetime when the lifetime follows the generalized Pareto distribution. Time duration of completing the experiment plays a vital role to finalize the acceptance sampling plan. The sample size is directly connected with the time duration of completing the experiment, so whichever plan will give the most suitable unknown variable (sample size) or average sample number under the specified values of producer’s risk and consumer’s risk will be regarded as more convenient. The average sample numbers of sequential sampling plan are calculated for different values of shape parameter, consumer’s risk and producer’s risk. We extant a simulation study to help the proposed techniques and a comparison between the repetitive acceptance sampling plan and sequential sampling plan is made. Furthermore, we present a comparative study of proposed plan with Rasay et al. (2018). For the proposed sampling plan some useful tables have been developed for practical utilization.
Srivastava, P.W.,Mittal, N. The Korean Reliability Society 2012 International Journal of Reliability and Applicati Vol.13 No.1
This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.
Aslam, Muhammad,Mughal, Abdur Razzaque,Hanif, Muhammad,Ahmad, Munir The Korean Statistical Society 2010 Communications for statistical applications and me Vol.17 No.5
Economic Reliability test plans(ERTP) are proposed considering that the life time of the submitted items follow the Pareto distribution of the second kind. For various specified acceptance number, sample size and producer's risk, a minimum test termination time is obtained. A comparison of proposed plan has been made with the existing plan developed by Aslam et al. (2010). The results are explained by tables and example.
Improved Group Acceptance Sampling Plan for Dagum Distribution under Percentiles Lifetime
Aslam, Muhammad,Shoaib, Muhammad,Khan, Hina The Korean Statistical Society 2011 Communications for statistical applications and me Vol.18 No.4
This paper deals with a group acceptance sampling plan for time truncated tests which are based on the total number of failures from the whole group assuming that the life time of an item follows the Dagum (inverse Burr) distribution. This study is developed when a multiple number of items as a group can be tested simultaneously in a tester. The minimum number of groups required for a given group size and acceptance number is determined such that the producer and consumer risks are satisfied simultaneously at the specified quality level, while the termination time and the number of testers are specified. Comparisons are made between the proposed plan and the existing plan on the basis of size of the groups. Two real examples are provided.