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Thatikonda Santhosh Kumar,Huang Wenhua,Du Xingru,Yao Chuangye,Ke Yifu,Wu Jiang,Qin Ni,Bao Dinghua 한국물리학회 2021 Current Applied Physics Vol.24 No.-
The antiferroelectric (Pb0.985Sm0.01) (Zr1-xTix)O3 (Ti-PSZO) thin films were synthesized on Pt(111)/Ti/SiO2/Si substrates using a chemical solution deposition method. The films were crystallized in the perovskite phase with a preferential orientation along (111) direction. With Ti doping in PSZO, a gradual transformation from antiferroelectric to ferroelectric phase transition was noticed at room temperature owing to the Ti doping induced lattice distortion. The phase transition has been confirmed through the P - E hysteresis loops, X-ray diffraction (peak shifting), capacitance-voltage measurements, and Raman scattering analysis. The thin film with Ti = 0.15 doping displayed a ferroelectric behavior with high dielectric constant and large dielectric tunability of about 62%. Also, Ti doping altered the Curie temperature (Tc) and enhanced the order of dielectric diffuseness. It is believed that Ti-doping in PSZO is an effective way to induce an antiferroelectric - ferroelectric phase transition and to tailor the electrical characteristics of PSZO thin films.
Bhuyan, Ranjan K.,Thatikonda, Santhosh K.,Dobbidi, Pamu,Renehan, J.M.,Jacob, Mohan V. Techno-Press 2014 Advances in materials research Vol.3 No.2
The microwave dielectric properties of $CeO_2$ nanoparticles (0.5, 1.0 & 1.5wt%) doped $Mg_2TiO_4$ (MTO) ceramics have been investigated at cryogenic temperatures. The XRD patterns of the samples were refined using the full proof program reveal the inverse spinel structure without any secondary phases. The addition of $CeO_2$ nanoparticles lowered the sintering temperature with enhancement in density and grain size as compared to pure MTO ceramics. This is attributed to the higher sintering velocity of the fine particles. Further, the microwave dielectric properties of the MTO ceramics were measured at cryogenic temperatures in the temperature range of 6.5-295 K. It is observed that the loss tangent ($tan{\delta}$) of all the samples increased with temperature. However, the $CeO_2$ nanoparticles doped MTO ceramics manifested lower loss tangents as compared to the pure MTO ceramics. The loss tangents of the pure and MTO ceramics doped with 1.5 wt% of $CeO_2$ nanoparticles measured at 6.5K are found to be $6.6{\times}10^{-5}$ and $5.4{\times}10^{-5}$, respectively. The addition of $CeO_2$ nanoparticles did not cause any changes on the temperature stability of the MTO ceramics at cryogenic temperatures. On the other hand, the temperature coefficient of the permittivity increased with rise in temperature and with the wt% of $CeO_2$ nanoparticles. The obtained lower loss tangent values at cryogenic temperatures can be attributed to the decrease in both intrinsic and extrinsic losses in the MTO ceramics.
Yifu Ke,Wenhua Huang,Santhosh Kumar Thatikonda,Ruqi Chen,Chuangye Yao,Ni Qin,Dinghua Bao 한국물리학회 2020 Current Applied Physics Vol.20 No.6
Excellent dielectric frequency, bias, and temperature stability of bismuth silicate (Bi2SiO5, BSO) thin films with a low dielectric loss has been obtained in this study. The thin films were prepared on Pt/Ti/SiO2/Si substrates by a chemical solution deposition method at a relatively low annealing temperature of 500 °C. The BSO films have a preferred growth along (200) orientation with dense fine-grained surface morphology. The dielectric constant and dielectric loss of the thin film annealed at 500 °C are 57 and 0.01, respectively, at 100 kHz, with little change between 1 kHz and 100 kHz and in the bias electric field range between−250 kV/cm and 250 kV/cm, indicating that the thin film exhibits a low dielectric loss as well as excellent frequency and bias field stability. The dielectric- temperature measurements confirmed that the BSO thin film annealed at 500 °C also has good temperature stability between 150 K and 450 K. Our results suggest that the BSO thin films have potential applications in the next-generation integrated capacitors.
Chuangye Yao,Wei Hu,Muhammad Ismail,Santhosh Kumar Thatikonda,Aize Hao,Shuai He,Ni Qin,Wenhua Huang,Dinghua Bao 한국물리학회 2019 Current Applied Physics Vol.19 No.11
We report the coexistence of resistive switching and magnetism modulation in the Pt/Co3O4/Pt devices, where the effects of thermal annealing and film thickness on the resistive and magnetization switching were investigated. The sol-gel derived nanocrystalline Co3O4 thin films obtained crack-free surface and crystallized cubic spinel structure. The 110 nm Co3O4 film based device annealed at 600 °C exhibited optimum resistive switching parameters. From I–V curves fitting and temperature dependent resistance, the conduction mechanism in the high-voltage region of high resistance state was dominated by Schottky emission. Magnetization-magnetic field loops demonstrated the ferromagnetic behaviors of the Co3O4 thin films. Multilevel saturation magnetization of the Co3O4 thin films can be easily realized by tuning the resistance states. Physical resistive switching mechanism can be attributed to the rejuvenation and annihilation of conductive filament consisting of oxygen vacancies. Results suggest that Pt/Co3O4/Pt device shows promising applications in the multifunctional electromagnetic integrated devices.