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Tetsutarou Oishi,Shigeru Morita,Chunfeng Dong,Motoshi Goto,Erhui Wang,Xianli Huang 한국물리학회 2014 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.64 No.6
Space-resolved vacuum ultraviolet (VUV) spectroscopy using a 3-m normal incidence spectrometeris utilized to measure the impurity emission profile in the edge and divertor plasmas of theLarge Helical Device (LHD). It measures the vertical profile of VUV lines emitted in the wavelengthrange of 300 − 3200 °A. CII, CIII, CIV, and CV lines emitted from carbon ions are successfully measured,and their ion temperatures are derived from the Doppler broadening. Vertical profiles ofthe emission intensity and the ion temperature are measured simultaneously for the CIV line. Theemission intensity profile, which has several peak structures, is reasonably explained by consideringthe relation between the C3+ ion distribution and the geometry used for the observations.