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Analysis on temperature dependent current mechanism of tunnel field-effect transistors
Lee, Junil,Kwon, Dae Woong,Kim, Hyun Woo,Kim, Jang Hyun,Park, Euyhwan,Park, Taehyung,Kim, Sihyun,Lee, Ryoongbin,Lee, Jong-Ho,Park, Byung-Gook IOP Publishing 2016 Japanese journal of applied physics Vol.55 No.6
<P>In this paper, the total drain current (I-D) of a tunnel FET (TFET) is decomposed into each current component with different origins to analyze the ID formation mechanisms of the TFET as a function of gate voltage (V-GS). Transfer characteristics are firstly extracted with fabricated Silicon channel TFETs (Si TFETs) and silicon germanium channel TFETs (SiGe TFETs) at various temperatures. The subthreshold swings (SS) of both Si TFETs and SiGe TFETs get degraded and the SSs of SiGe TFETs get degraded more as temperature becomes higher. Then, all the I(D)s measured at various temperatures are decomposed into each current component through technology computer aided design (TCAD) simulations with a good agreement with experimental data. As a result, it is revealed that Shockley-Read-Hall (SRH) recombination mainly contribute to the I-D of a TFET before band to band tunneling (BTBT) occurs. Furthermore, the SS degradation by high temperature is explained successfully by the SRH recombination with electric field dependence. (C) 2016 The Japan Society of Applied Physics</P>
차량 인포테인먼트 임베디드 소프트웨어를 위한 예외처리 테스트 자동화 방안
이시현(Sihyun Lee),오정석(Jungsuk Oh),배현철(Hyuncheol Bae),양승완(Seungwan Yang) 한국자동차공학회 2012 한국자동차공학회 부문종합 학술대회 Vol.2012 No.5
An embedded system requires test process for reality of the system. For this, it is important to test exception handling which programmer developed. Especially, embedded system is required to test input from hardware device and external signal. But, manual test is required much time and low reality. And it is hard to reproduce faulty situation for debugging. In this paper, we propose a new exception handling test criteria for an embedded system. For this criteria, we define exception type and test exception handling using fault injection technique. And we propose generation of test data for occurring exception situation.