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Open Lead Detection Based on Logical Change Caused by AC Voltage Signal Stimulus
Akira Ono,Masahiro Ichimiya,Hiroyuki Yotsuyanagi,Masao Takagi,Masaki Hashizume 대한전자공학회 2008 ITC-CSCC :International Technical Conference on Ci Vol.2008 No.7
In this paper, we propose a new test method for detecting an open lead which occurs when an IC is mounted on a printed circuit board. In the method, an open lead is detected by observing output logical change of an open lead detector. Since the test method is a vectorless test one, test generation and test input application are not needed. Testability of the test method is examined by some experiments. The results show that open leads of SSIs and LSIs will be detected by the method.