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TRAO Multi-beam Legacy Survey of Nearby Filamentary Molecular Clouds : Progress Report
ShinYoung Kim,Eun Jung Chung,Chang Won Lee,Philip C. Myers,Paola Caselli,Mario Tafalla,Gwanjeong Kim,Miryang Kim,Archana Soam,Maheswar Gophinathan,Tie Liu,Kyounghee Kim,Woojin Kwon,Jongsoo Kim 한국천문학회 2017 天文學會報 Vol.42 No.1
Electrochemical migration behavior of a fine-pitch IC substrate by alternating current.
Kim, JongSoo,Park, MiSeok,Nam, DoHwan,Kwon, HyukSang American Scientific Publishers 2014 Journal of Nanoscience and Nanotechnology Vol.14 No.11
<P>Electrochemical migration properties of fine pitch chip-on-flex (COF) for displays were investigated by a water drop test and scanning electron microscope with energy dispersive spectroscopy. While the time to failure due to ECM is less than 1 s at a direct current (DC) bias of 10 V, it is approximately 330 s at an alternating current (AC) bias of 10 V 10 Hz and approximately 3,940 s at 240 Hz. The ECM failure mode due to AC bias appears to be caused by limitations on the degree of ion diffusion and relatively small changes of the pH, unlike the DC bias case.</P>