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Nguyen, Giang D.,Lee, Jinhwan,Berlijn, Tom,Zou, Qiang,Hus, Saban M.,Park, Jewook,Gai, Zheng,Lee, Changgu,Li, An-Ping American Physical Society 2018 Physical Review B Vol.97 No.1
<P>The magnetic domains in two-dimensional layered material Fe3GeTe2 are studied by using a variable-temperature scanning tunneling microscope with a magnetic tip after in situ cleaving of single crystals. A stripy domain structure is revealed in a zero-field-cooled sample below the ferromagnetic transition temperature of 205 K, which is replaced by separate double-walled domains and bubble domains when cooling the sample under a magnetic field of a ferromagnetic Ni tip. The Ni tip can further convert the double-walled domain to a bubble domain pattern as well asmove the Neel-type chiral bubble in submicrometer distance. The temperature-dependent evolutions of both zero-field-cooled and field-cooled domain structures correlate well with the bulkmagnetization from magnetometry measurements. Atomic resolution scanning tunneling images and spectroscopy are acquired to understand the atomic and electronic structures of the material, which are further corroborated by first-principles calculations.</P>
Murakami, Katsuhisa,Rommel, Mathias,Hudec, Boris,Rosová,, Alica,Huš,eková,, Kristí,na,Dobroč,ka, Edmund,Rammula, Raul,Kasikov, Aarne,Han, Jeong Hwan,Lee, Woongkyu,Song, S American Chemical Society 2014 ACS APPLIED MATERIALS & INTERFACES Vol.6 No.4
<P>Topography and leakage current maps of TiO<SUB>2</SUB> films grown by atomic layer deposition on RuO<SUB>2</SUB> electrodes using either a TiCl<SUB>4</SUB> or a Ti(O-i-C<SUB>3</SUB>H<SUB>7</SUB>)<SUB>4</SUB> precursor were characterized at nanoscale by conductive atomic force microscopy (CAFM). For both films, the leakage current flows mainly through elevated grains and not along grain boundaries. The overall CAFM leakage current is larger and more localized for the TiCl<SUB>4</SUB>-based films (0.63 nm capacitance equivalent oxide thickness, CET) compared to the Ti(O-i-C<SUB>3</SUB>H<SUB>7</SUB>)<SUB>4</SUB>-based films (0.68 nm CET). Both films have a physical thickness of ∼20 nm. The nanoscale leakage currents are consistent with macroscopic leakage currents from capacitor structures and are correlated with grain characteristics observed by topography maps and transmission electron microscopy as well as with X-ray diffraction.</P><P><B>Graphic Abstract</B> <IMG SRC='http://pubs.acs.org/appl/literatum/publisher/achs/journals/content/aamick/2014/aamick.2014.6.issue-4/am4049139/production/images/medium/am-2013-049139_0008.gif'></P><P><A href='http://pubs.acs.org/doi/suppl/10.1021/am4049139'>ACS Electronic Supporting Info</A></P>