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Study on the Adhesive Properties of Polyesters Reinforcing Materials
( H. Krump ),( I. Hudec ),( M. Cernak ),( P. Janypka ) 한국고무학회 2002 엘라스토머 및 콤포지트 Vol.37 No.3
N/A Polyester cord yarns have been treated in an atmospheric-pressure nitrogen plasma reactor in order to enhance their adhesion to rubber. A thin layer of the plasma was generated in the close vicinity of the yarn surface using various types of surface discharge. To assess the effect of the plasma treatment on fiber surface properties, the cord thread/rubber matrix adhesion values measured using the untreated and treated cord threads were compared. The static and dynamic adhesion of the cord thread to rubber was characterized by using the standard Henley test. The dynamic adhesion values for the reference and plasma treated fiber were 7,3 ± 1,2 N and 83,5 ± 3,5 N. The surface properties were investigated by scanning electron microscopy, infrared spectroscopy and electron spin resonance spectroscopy. It is concluded that both polar group interactions and increased surface area of the fibers are responsible for the improved adhesive strength.
Murakami, Katsuhisa,Rommel, Mathias,Hudec, Boris,Rosová,, Alica,Huš,eková,, Kristí,na,Dobroč,ka, Edmund,Rammula, Raul,Kasikov, Aarne,Han, Jeong Hwan,Lee, Woongkyu,Song, S American Chemical Society 2014 ACS APPLIED MATERIALS & INTERFACES Vol.6 No.4
<P>Topography and leakage current maps of TiO<SUB>2</SUB> films grown by atomic layer deposition on RuO<SUB>2</SUB> electrodes using either a TiCl<SUB>4</SUB> or a Ti(O-i-C<SUB>3</SUB>H<SUB>7</SUB>)<SUB>4</SUB> precursor were characterized at nanoscale by conductive atomic force microscopy (CAFM). For both films, the leakage current flows mainly through elevated grains and not along grain boundaries. The overall CAFM leakage current is larger and more localized for the TiCl<SUB>4</SUB>-based films (0.63 nm capacitance equivalent oxide thickness, CET) compared to the Ti(O-i-C<SUB>3</SUB>H<SUB>7</SUB>)<SUB>4</SUB>-based films (0.68 nm CET). Both films have a physical thickness of ∼20 nm. The nanoscale leakage currents are consistent with macroscopic leakage currents from capacitor structures and are correlated with grain characteristics observed by topography maps and transmission electron microscopy as well as with X-ray diffraction.</P><P><B>Graphic Abstract</B> <IMG SRC='http://pubs.acs.org/appl/literatum/publisher/achs/journals/content/aamick/2014/aamick.2014.6.issue-4/am4049139/production/images/medium/am-2013-049139_0008.gif'></P><P><A href='http://pubs.acs.org/doi/suppl/10.1021/am4049139'>ACS Electronic Supporting Info</A></P>