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황색종 연초 품종의 Gamma선에 의한 돌연변이 유기 및 변이형질의 유전분석 II. 변이형질의 유전분석
정석훈,이승철,김흥배,Jeong, Seok-Hun,Lee, S.C.,Kim, H.B. 한국연초학회 1992 한국연초학회지 Vol.14 No.2
This experiment was conducted to examine characteristics of agronomic characters and estimate of gene effect for several mutant characters. The genetic populations were derived from cross between 83H-5 and Hicks. There were significant difference for plant height, stlk height, leaf shape and bacterial wilt disease index except leaf number, leaf length, and what is more, F3 variance is more than Bl and B2 generation from cross 83H-5 X Hicks. Gene actions for stalk height and bacterial wilt disease were estimated by 3-parameter, and by 6- parameter model for all characters except above two characters but stalk height and bacterial wilt disease index are not significant in the additive and dominance effects. Dominant$\times$dominant epitasis for plant height, dominant and dominant$\times$dominant epistasis for leaf length, additive and additive$\times$additive and dominant$\times$dominant epistasis for leaf width, and additive and additive$\times$dominant epistasis for days to flower were appeared significant in gene action.
김흥배(H. B. Kim) 한국생산제조학회 2005 한국공작기계학회 추계학술대회논문집 Vol.2005 No.-
This paper discusses the possibility of nano fabrication by introducing new concept of variable dwell time in Focused Ion Beam (FIB) machining. Even through the FIB machine has great potential in nano fabrication of sub 100㎚. It has several limitations, re-deposition of sputtered atoms, damages, and swelling of surfaces in low doses region. By that reasons, it is generally recognized that the fabrication of arbitrary shape is problematic. In the present paper, we propose a new machining concept of utilizing variable dwell time at a certain pixel. By simulation approach, we verified the possibility the proposed concept and demonstrate applications.
Responses of Sex Expression and Fiber Yield Components to Ethrel and RH-531 Treatments in Hemp
H.B. Kim(金興培),K.J. Kim(金炅濟) 한국육종학회 1971 한국육종학회지 Vol.3 No.1
1. Ethrel 및 RH-531을 大麻의 花芽分化期에 葉面撤布하여 雌雄植物의 數, 草長, 줄기의 둘레 및 重量에 미치는 效果에 對해서 硏究하였다. 2. 無處理에서는 雌植物이 91%이었는데 Ethrel 500ppm에서는 112%, Ethrel 1000ppm에서는 116%, 그리고 RH-531 1000ppm에서는 121%로서 이들藥處理가 雌植物의 比率을 增加시키는데 效果가 있었고 特히 RH-531 1000ppm이 效果가 가장 많았다. 그러나 藥劑撒布濃度가 높은 1000ppm에서는 全體의 植物體數가 減少하였다. 3. 植物體의 重量 및 草長은 藥劑撒布後 無處理에 比해 약간의 증감은 있었으나 별로 큰 差異가 아니었다. 4. 줄기의 最下位部의 둘레는 無處理에 比해 Ethrel 500ppm이 7.54%, Ethrel (1000ppm) 2.3% 그리고 RH-531의 3.31% 增加를 보이었으나 統計分析有意性은 없었다. Responses of sex expression, plant height, plant weight and diameter of the stem to Ethrel and RH-531 treatments were studied in a local variety of hemp(Canabis sative L.). Proportion of the female plants were much greater than the male plants at the different levels of the chemicals. Plant height and plant weight were not increased at any concentrations of the chemical treatment. Stem diameter measured at the base of the plant showed slight increases over the control being test at 500 ppm of Ethrel treatment but there was no significance in statistical analysis.
김흥배(H. B. Kim) 한국생산제조학회 2005 한국공작기계학회 추계학술대회논문집 Vol.2005 No.-
Due to the ability of direct patterning of various engineering materials, the use of ion beams in industries is increased as is increased the needs of producing macro / nano scale parts. And the use of focused ion beam(FIB) and ion milling in combinational way has a great potential in MEMS (Micro Electro Mechanical Systems) fabrication with various ways. Re-deposition, is the serious problem in ion beam direct fabrication, fluxes is the kinds of byproduct of sputtering caused by energetic ion incidence on substrate as the results of ion beam-solid interactions. Surface evolution during growth and erosion has been a subject of great academic and technological interest in recent year. This paper discusses the profiles changes induced by ion milling process considering the re-deposition flux. Several examples are demonstrated to verify the results of numerical calculation.
김흥배(H. B. Kim) 한국생산제조학회 2005 한국생산제조시스템학회 학술발표대회 논문집 Vol.2005 No.10
This paper discusses the possibility of nano fabrication by introducing new concept of variable dwell time in Focused Ion Beam (FIB) machining. Even through the FIB machine has great potential in nano fabrication of sub 100㎚. It has several limitations, re-deposition of sputtered atoms, damages, and swelling of surfaces in low doses region. By that reasons, it is generally recognized that the fabrication of arbitrary shape is problematic. In the present paper, we propose a new machining concept of utilizing variable dwell time at a certain pixel. By simulation approach, we verified the possibility the proposed concept and demonstrate applications.
“AMADEUS” Software for Ion Beam Nano Patterning and Characteristics of Nano Fabrication
김흥배(H. B. Kim),G. Hobler,A. Lugstein,E. Bertagonolli 한국정밀공학회 2005 한국정밀공학회 학술발표대회 논문집 Vol.2005 No.10월
The shrinking critical dimensions of modern technology place a heavy requirement on optimizing feature shapes at the micro- and nano scale. In addition, the use of ion beams in the nano-scale world is greatly increased by technology development. Especially, Focused Ion Beam (FIB) has a great potential to fabricate the device in nano-scale. Nevertheless, FIB has several limitations, surface swelling in low ion dose regime, precipitation of incident ions, and the re-deposition effect due to the sputtered atoms. In recent years, many approaches and research results show that the re-deposition effect is the most outstanding effect to overcome or reduce in fabrication of micro and nano devices. A 2D string based simulation software AMADEUS-2D (UAUdvanced UMUodeling UaUnd UDUesign UEUnvironment for USUputter Processes) for ion milling and FIB direct fabrication has been developed. It is capable of simulating ion beam sputtering and re-deposition. In this paper, the 2D FIB simulation is demonstrated and the characteristics of ion beam induced direct fabrication is analyzed according to various parameters. Several examples, single pixel, multi scan box region, and re-deposited sidewall formation, are given.
김흥배(H. B. Kim) 한국생산제조학회 2005 한국생산제조시스템학회 학술발표대회 논문집 Vol.2005 No.10
Due to the ability of direct patterning of various engineering materials, the use of ion beams in industries is increased as is increased the needs of producing macro / nano scale parts. And the use of focused ion beam(FIB) and ion milling in combinational way has a great potential in MEMS (Micro Electro Mechanical Systems) fabrication with various ways. Re-deposition, is the serious problem in ion beam direct fabrication, fluxes is the kinds of byproduct of sputtering caused by energetic ion incidence on substrate as the results of ion beam-solid interactions. Surface evolution during growth and erosion has been a subject of great academic and technological interest in recent year. This paper discusses the profiles changes induced by ion milling process considering the re-deposition flux. Several examples are demonstrated to verify the results of numerical calculation.
Analysis of Ion Beam-Solid Interactions for Nano Fabrication
김흥배(H. B. Kim),G. Hobler 한국정밀공학회 2005 한국정밀공학회 학술발표대회 논문집 Vol.2005 No.10월
Ion beam processing is one of the key technologies to realize maskless and resistless sub 50nm nano fabrication. Unwanted effects, however, may occur since an energetic ion can interact with a target surface in various ways. Depending on the ion energy, the interaction can be swelling, deposition, sputtering, re-deposition, implantation, damage, backscattering and nuclear reaction. Sputtering is the fundamental mechanism in ion beam induced direct patterning. Re-deposition and backscattering are unwanted mechanisms to avoid. Therefore understanding of ion beam-solid interaction should be advanced for further ion beam related research. In this paper we simulate some important interaction mechanisms between energetic incident ions and solid surfaces and the results are compared with experimental data. The simulation results are agreed well with experimental data.