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Investigation of the Photovoltaic Effect in Solar Cells by Using a Near-field Microwave Microscope
Arsen Babajanyan,Tigran Sargsyan,Harutyun Melikyan,Seungwan Kim,Jongchel Kim,이기진 한국물리학회 2009 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.55 No.1
A near-field microwave microscope (NFMM) technique has been used to investigate the photovoltaic effect in solar cells. By measuring the reflection coefficient S11 at an operating frequency near 4.1 GHz, we could observe the photoconductivity changes inside the solar cells. The photoconductivity of the n-type silicon layer in a solar cell increased as the incident light’s intensity was increased due to the carrier motion through the pn junction. The photoconductivity also varied with the incident light’s wavelength. We found good agreement between the variations in the microwave reflection coefficient S11 and the IV characteristics of solar cells for different incidentlight intensities and wavelengths. A near-field microwave microscope (NFMM) technique has been used to investigate the photovoltaic effect in solar cells. By measuring the reflection coefficient S11 at an operating frequency near 4.1 GHz, we could observe the photoconductivity changes inside the solar cells. The photoconductivity of the n-type silicon layer in a solar cell increased as the incident light’s intensity was increased due to the carrier motion through the pn junction. The photoconductivity also varied with the incident light’s wavelength. We found good agreement between the variations in the microwave reflection coefficient S11 and the IV characteristics of solar cells for different incidentlight intensities and wavelengths.
Arsen Babajanyan,Lkhamsuren Enkhtur,Balt-Erdene Khishigbadrakh,Harutyun Melikyan,Youngwoon Yoon,Songhui Kim,이한주,김태동,이기진,Barry Friedman 한국물리학회 2011 Current Applied Physics Vol.11 No.2
To study the anisotropic electric transport properties of Copper-(II)-Phthalocyanine (CuPc) thin films we measured the conductivity of a CuPc organic field-effect transistor using a near-field scanning microwave microscope by measuring the microwave reflection coefficient S11. The orientation of grains depended on the heat-treatment condition and the temperature of the substrate during film deposition. The fieldeffect mobility of the CuPc thin film annealed at 300 ℃ was increased about 5 times compared to the film formed at room temperature and 17 times larger than that prepared by deposition at 300 ℃.
Noncontact characterization of glucose by a waveguide microwave probe
Kim, S.,Kim, J.,Babajanyan, A.,Lee, K.,Friedman, B. Elsevier 2009 Current Applied Physics Vol.9 No.4
We investigate the electromagnetic field interaction with a glucose aqueous solution using a microwave dielectric waveguide probe to evaluate the glucose concentrations. A microwave dielectric waveguide probe allows observation of the small variation of the glucose concentration changes in the range of 0-300mg/ml by measuring the change of the microwave reflection coefficient. We could observe the effect of concentration change of glucose with a detectable resolution up to 0.5mg/ml at an operating frequency of about f=2.0-2.5GHz. The change of the glucose concentration is directly related to the change of the reflection coefficient due to the electromagnetic interaction between the dielectric waveguide resonator and the glucose aqueous solution. The operational principal is explained by a plane-wave solution model. A glucose biosensor using a microwave dielectric waveguide probe provides a unique approach for glucose monitoring.
Arakelyan, Shant,Lee, Hanju,Babajanyan, Arsen,Kim, Seungwan,Berthiau, Gerard,Friedman, Barry,Lee, Kiejin IEEE 2019 IEEE antennas and propagation magazine Vol.61 No.2
<P>Using the thermoelastic optical indicator microscopy (TEOIM) technique, we perform the visualization of the near-field distribution of a patterned frequencymodulation (FM) antenna. For the defect characterization, subtraction of images is done, whereas a background image is used for the defect-free antenna image. The electromagnetic fields distribution in the overall antenna structure is changed due to the defects, and this indicates the local impedance changes of the antenna pattern. The sensitivity of the proposed inspection technique is estimated to be in orders of a few milliwatts. In addition, a 3D visualization of the antenna transmission is realized to describe the field intensity and distribution dependences on the distance from the antenna surface. This type of investigation with a visualization opportunity may become an important tool for engineers and researchers, and it can successfully be a supplement for existing measurement techniques.</P>
Harutyun Melikyan,Tigran Sargsyan,Arsen Babajanyan,Seungwan Kim,Jongchel Kim,이기진 한국물리학회 2009 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.55 No.1
A near-field scanning microwave microscope (NSMM) system incorporating an atomic force microscope (AFM) cantilever probe tip was used for the direct imaging of magnetic domains The NSMM images of domain were obtained by measuring the microwave reflection coefficient S11 at an operating frequency near 4.1 GHz and were compared with the magnetic force microscope (MFM) image. The AFM cantilever probe tip with the NSMM coupled to the tuning fork distance control system provided nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitatively measuring of magnetic domains with nano-scale resolution and high sensitivity. A near-field scanning microwave microscope (NSMM) system incorporating an atomic force microscope (AFM) cantilever probe tip was used for the direct imaging of magnetic domains The NSMM images of domain were obtained by measuring the microwave reflection coefficient S11 at an operating frequency near 4.1 GHz and were compared with the magnetic force microscope (MFM) image. The AFM cantilever probe tip with the NSMM coupled to the tuning fork distance control system provided nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitatively measuring of magnetic domains with nano-scale resolution and high sensitivity.